Abstract:The transient electrothermal (TET) technique was developed and has been widely used for measuring the thermal diffusivity of fiber- and film-like materials at the micro/nanoscale. Upon step-current heating, the measured voltage-time (V V-t) t ) of the sample usually follows a sole increasing or decreasing trend, depending on the temperature coefficient of its electrical resistivity (BT B T = d rho e/dT, e / dT, rho e : electrical resistivity, T : temperature). Past physical mode for the V-t t profile is based on an assumption that BT T is constant during TET measurement, which applies to a large variety of materials. However, for semiconductive materials, BT T depends on the charge carrier density and scattering time, and both vary with temperature. Therefore, BT T has very strong nonlinear change with temperature, sometimes changes sign during TET measurement. This leads to abnormal V-t t profiles that have never been addressed well, thereby making TET measurement not applicable for such scenarios. In this work, a new physical model is developed to consider the strong nonlinear relation between rho e e and T to the third order. Our numerical modeling firmly proves the validity of this new model. Thin films of graphene (GreF) and single- walled carbon nanotube (SWCNTs) mat are measured using the TET technique over a wide temperature range: 84.5-690.9 K for the GreF, and 12-290 K for the SWCNT film. At a specific temperature for each sample, a semiconductive-to-metallic transition comes about and manifests in the resistance-temperature response, hence leading to abnormal TET signals. These TET signals are perfectly fitted using our nonlinear BT T T model to determine alpha . Intriguingly, the determined alpha of the GreF for the transition phase follows the overall alpha T trend, confirming the robustness of the model. The obtained alpha T trend is interpreted well using the thermal reffusivity theory and structure deterioration under temperature change. This work significantly extends the capability of TET to semiconductors for alpha measurement. Also, the new methodology developed for obtaining alpha at zero temperature rise significantly improves the measurement control and accuracy.

Temperature and lifetime measurements in the SSX wind tunnel

Temperature- and Pressure-Sensitive Paint Measurements in Short-Duration Hypersonic Flow

Measurement of radiation temperature with high time-resolution

Electron Temperature Gradient Turbulence: Validation in the Columbia Linear Machine Experiments

Inductively Coupled Facility Qualification for Electron Transpiration Cooling Investigations

Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature, Current, and Magnetic Field with IV curve and Complex Admittance Measurements

Thermal Diffusivity Characterization of Semiconductive 1D Micro/nanoscale Structures

Total Electron Temperature Derived from Quasi-Thermal Noise Spectroscopy In the Pristine Solar Wind: Parker Solar Probe Observations

Measurements of electron thermal transport due to electron temperature gradient modes in a basic experiment

Simulating a Low-Temperature Maxwellian Plasma Using SH-HtscEBIT

Millisecond Time-Scale Measurements of Heat Transfer to an Open Bath of He II

Analysis of experimental conditions for simultaneous measurements of transport and magnetotransport coefficients of high temperature superconductors

Measurement of Stark-split beam and carbon charge exchange emissions for simultaneous B-field and temperature/rotation analysis at DIII-D

Estimation of turbulent proton and electron heating rates via Landau damping constrained by Parker Solar Probe observations

Near-field heat transfer in a scanning thermal microscope

Shock-Layer Measurements in T5 Shock Tunnel Hypersonic Flows Around a Cylinder Model

First Ion Temperature Measurements in the MAST-U Divertor via Retarding Field Energy Analyzer

Towards Model-free Temperature Diagnostics of Warm Dense Matter from Multiple Scattering Angles

Electron Temperature Inversion by Stimulated Brillouin Scattering During Electron Gyroharmonic Heating at EISCAT

A Michelson Interferometer for Electron Cyclotron Emission Measurements on EAST

Towards Measuring the Maxwell–Boltzmann Distribution of a Single Heated Particle