The Young-Laplace's equation for solid

Zaixing Huang
DOI: https://doi.org/10.1080/09500839.2018.1528014
2018-06-07
Abstract:The Young-Laplace's equation is established based on liquid membrane without shearing resistance. It is not valid for solid. By taking into account the in-plane shearing and transverse shearing within the surface layer, we reconstruct the Young-Laplace's equation so as to characterize the surface of solid. A new version of the Young-Laplace's equation is proposed. It shows that the surface equilibrium of solid is determined by the bulk stress, surface membrane stress and surface transverse stress together. The transverse shear stress depends on the gradient of the Gaussian curvature of surface and strain. The intrinsic membrane stress and surface transverse shear stress cause the residual stresses to appear in the interior of solid. The intrinsic surface transverse shear stress only occurs in the non-spherical body.
Materials Science,Mesoscale and Nanoscale Physics,Chemical Physics
What problem does this paper attempt to address?
The problem that this paper attempts to solve is: The existing Young - Laplace equation has limitations in describing solid surfaces because it is based on the liquid - film model and cannot take into account the lateral shear effect within the solid surface layer. Specifically: 1. **Limitations of the existing theory**: - The Young - Laplace equation was originally established for liquid films. Liquid films cannot bear infinite shear stress, so this equation is not applicable to solids. - The existing theories and models are all based on the zero - thickness film model and cannot take into account the lateral shear effect within the solid surface layer. 2. **New problems introduced**: - Due to the non - uniformity of the energy distribution within the surface layer, an energy gradient appears, and thus there is inevitably a lateral shear stress on the cross - section of the surface layer. - If there is a shear force on the internal interface of the solid surface layer, it will also cause the lateral shear effect within the surface layer. 3. **Research objectives**: - The paper aims to re - construct a generalized Young - Laplace equation applicable to solids by introducing the lateral shear effect. - Emphasize the influence of the lateral shear stress on the solid - surface equilibrium, especially that it, together with the bulk stress and the surface - film stress, determines the equilibrium state of the solid surface. - Explore how the internal - film stress and the surface - lateral - shear stress cause residual stress in the solid interior, and point out that this internal - lateral - shear stress only occurs in non - spherical objects. ### Specific problems and solutions - **Introducing the lateral - shear effect**: - By introducing the lateral - shear - stress term and considering the lateral - shear effect within the surface layer, the traditional Young - Laplace equation is modified. - The lateral - shear stress depends on the gradient and deformation of the surface Gaussian curvature. - **Generalized Young - Laplace equation**: - A new version of the generalized Young - Laplace equation that includes the lateral - shear effect is proposed, indicating that the equilibrium of the solid surface is determined jointly by the bulk stress, the surface - film stress, and the surface - lateral - shear stress. - **Influence of the internal stress**: - The internal - film stress and the surface - lateral - shear stress will cause residual stress in the solid interior. - The internal - lateral - shear stress only exists in non - spherical objects because spherical objects have symmetry and will not generate this stress. ### Conclusion By introducing the lateral - shear effect, the paper has successfully extended the application range of the Young - Laplace equation, enabling it to describe the mechanical behavior of solid surfaces more accurately. This improvement is of great significance for understanding the influence of solid - surface effects on the overall performance at the micro - and nano - scales.