A.V. Vasev,M.A. Putyato,V.V. Preobrazhenskii
Abstract:The evolution of RHEED reflexes intensity during reconstructed transitions characterizes (often implicitly) reconstructed surface state peculiarities. The approaches of a correct RHEED data interpretation, aimed at obtaining information about reconstructed transitions kinetics, are considered in the present work. In particular, the nature of RHEED reflexes formation, depending on such parameters as the average size of reconstructed domains and number of such domains per area unit, is analyzed within the kinematic approximation of the diffraction theory. This geometrical description is a convenient and effective (productive) way of analyzing reconstructed transitions mechanisms and parameters. The transformation of the functional dependence between the measured values (RHEED reflexes intensity picture) and the degree of surface coverage by reconstruction domains, at a change of these domains average size and distribution density, is shown. This work provides the community with a useful framework for such type of theoretical studies.
What problem does this paper attempt to address?
The problem that this paper attempts to solve is: the functional dependence between the reflection high - energy electron diffraction (RHEED) reflection intensity and the surface reconstruction domain coverage during the superstructure transformation on the reconstructed crystal surface. Specifically, the author aims to develop new methods to interpret RHEED data, especially when considering the finite linear size of the coherent region, in order to obtain information about the reconstruction transformation kinetics.
### Core of the problem
1. **Variation of RHEED reflection intensity**: The variation of RHEED reflection intensity can characterize the properties of the reconstructed surface state. However, it is very difficult to directly recover the spatial distribution of the reflected wave from the RHEED reflection intensity image, especially in the absence of prior information about the composition, structure, and rearrangement mechanism of the reconstruction layer.
2. **Complex multi - step process**: For processes with a complex multi - step nature, simple techniques (such as revealing the exponential dependence in the sequence of measurement data) may lead to incorrect result interpretations, such as incorrect values of activation energy.
3. **Need for new analysis methods**: New methods need to be developed to analyze experimental RHEED data, especially when studying complex multi - step processes.
### Goals of the paper
- **Develop new methods**: Considering the influence of the finite linear size of the coherent region, develop new methods to recover the spatial distribution of the electron wave reflected from the crystal surface.
- **Analyze the dependence**: Solve the dependence between the RHEED reflection intensity and the surface reconstruction domain coverage, especially the influence of the average reconstruction domain size and the number of these domains per unit area on this dependence.
### Main contributions
- **Influence of geometric parameters**: Research shows that the geometric parameters of the reconstruction domain (average size and the number within the unit area) determine the type of functional dependence between the RHEED reflection intensity and the surface coverage.
- **Different types of dependence**: Depending on the conditions, different types of functional dependence can be observed, including linear, mixed (containing both quadratic and linear terms simultaneously), linear - quadratic, and pure quadratic relations.
Through these studies, the author provides a useful framework for theoretical research and important guidance for the application of RHEED in the study of the superstructure transformation kinetics of the reconstructed crystal surface.
### Formula summary
The formulas involved in the paper are mainly used to describe the scattering and interference processes of electron waves. Here are several key formulas:
1. **Expression of the scattered wave**:
\[
E_{Sl}=\sum_{j = 1}^{N_{uc}}E_0e^{i\mathbf{k}\cdot\mathbf{r}_j}
\]
where \(\mathbf{k}\) is the scattering vector, and \(\mathbf{r}_j\) is the position vector from the origin of coordinates to the lattice point \(j\).
2. **RHEED reflection intensity**:
\[
I_l=\left|E_{Sl}\right|^2
\]
3. **Scattered wave of the reconstruction domain**:
\[
E_{Sl}=E_{Sl}^D + E_{Sl}^E
\]
where \(E_{Sl}^D\) and \(E_{Sl}^E\) represent the scattered waves in state \(D\) and state \(E\), respectively.
4. **Mixed dependence**:
\[
I(Q)=I_D(Q)+I_E(1 - Q)
\]
where \(Q\) is the degree of the surface covered by state \(D\).
These formulas help to understand how the RHEED reflection intensity changes with the change of the surface reconstruction domain, thus providing a theoretical basis for interpreting experimental data.