Performance Evaluation of the Analogue Front-End and ADC Prototypes for the Gotthard-II Development

Jiaguo Zhang,Marie Andrä,Rebecca Barten,Anna Bergamaschi,Martin Brückner,Roberto Dinapoli,Erik Fröjdh,Dominic Greiffenberg,Carlos Lopez-Cuenca,Davide Mezza,Aldo Mozzanica,Marco Ramilli,Sophie Redford,Marie Ruat,Christian Ruder,Bernd Schmitt,Xintian Shi,Dhanya Thattil,Gemma Tinti,Monica Turcato,Seraphin Vettera
DOI: https://doi.org/10.1088/1748-0221/12/12/C12052
2018-01-03
Abstract:Gotthard-II is a silicon microstrip detector developed for the European X-ray Free-Electron Laser (<a class="link-external link-http" href="http://XFEL.EU" rel="external noopener nofollow">this http URL</a>). Its potential scientific applications include X-ray absorption/emission spectroscopy, hard X-ray high resolution single-shot spectrometry (HiREX), energy dispersive experiments at 4.5 MHz frame rate, beam diagnostics, as well as veto signal generation for pixel detectors. Gotthard-II uses a silicon microstrip sensor with a pitch of 50 $\mu$m or 25 $\mu$m and with 1280 or 2560 channels wire-bonded to readout chips (ROCs). In the ROC, an adaptive gain switching pre-amplifier (PRE), a fully differential Correlated-Double-Sampling (CDS) stage, an Analog-to-Digital Converter (ADC) as well as a Static Random-Access Memory (SRAM) capable of storing all the 2700 images in an <a class="link-external link-http" href="http://XFEL.EU" rel="external noopener nofollow">this http URL</a> bunch train will be implemented. Several prototypes with different designs of the analogue front-end (PRE and CDS) and ADC test structures have been fabricated in UMC-110 nm CMOS technology and their performance has been evaluated. In this paper, the performance of the analogue front-end and ADC will be summarized.
Instrumentation and Detectors
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