X-ray and neutron reflectometry study of copper surface reconstruction caused by implantation of high-energy oxygen ions

Yu. N. Khaydukov,O. Soltwedel,Yu. A. Marchenko,D. Yu. Khaidukova,A. Csik,T. Acartürk,U. Starke,T. Keller,A. G. Guglya,Kh. R. Kazdayev
DOI: https://doi.org/10.1134/S1027451017010293
2014-12-14
Abstract:Combination of neutron and X-ray reflectometry was used to study the vertical structure of 100 nm-thin copper films with implanted oxygen ions of energy E = [10-30] keV and doses D=[0.2-5.4]x$10^{16}$ $cm^{-2}$. The study shows that oxygen ion implantation with an energy of E = 30 keV leads to the formation of a 3 nm thick layer on the surface. Density and copper/oxygen stoichiometry of the observed surface layer are close to $Cu_2O$ oxide. We attribute the $Cu_2O$ oxide formation to highly mobilized copper atoms generated by stimulated ion implantation.
Materials Science
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