Probing of electromagnetic fields on atomic scale by photoelectric phenomena in graphene

Peter Olbrich,Christoph Drexler,Leonid E. Golub,Sergey N. Danilov,Vadim A. Shalygin,Rositza Yakimova,Samuel Lara-Avila,Sergey Kubatkin,Britta Redlich,Rupert Huber,Sergey D. Ganichev

DOI: https://doi.org/10.48550/arXiv.1308.0123

2013-08-01

Abstract:We report on the observation of the reststrahl band assisted photocurrents in epitaxial graphene on SiC excited by infrared radiation. The peculiar spectral dependence for frequencies lying within the reststrahl band of the SiC substrate provides a direct and noninvasive way to probe the electric field magnitude at atomic distances from the material's surface. Furthermore our results reveal that nonlinear optical and optoelectronic phenomena in 2D crystals and other atomic scale structures can be giantly enhanced by a proper combination of the spectral range and substrate material.

Mesoscale and Nanoscale Physics

What problem does this paper attempt to address?

The problem that this paper attempts to solve is: How to detect the intensity of electromagnetic fields at the atomic scale, especially in two - dimensional materials (such as graphene). Specifically, by studying the photoelectric effect of graphene under infrared radiation at a specific frequency, the author aims to develop a direct and non - invasive method to measure the electric field intensity near the material surface.

### Analysis of the Core Problems in the Paper

1. **Background and Motivation**:
- Since the discovery of graphene, the optical and photoelectric properties of two - dimensional crystalline materials have attracted wide attention.
- In these materials, the effect of the local electromagnetic field on charge carriers is a key parameter, especially at the nano - scale and atomic - scale.
- However, measuring the electric field at the atomic scale is very challenging, and traditional near - field microscopes and other methods cannot achieve the required precision.

2. **Proposed Method**:
- The author utilizes the photoelectric effect of graphene on the SiC substrate, especially when the frequency of the excitation light is within the reststrahl band of the SiC substrate, the photocurrent shows a significant spectral dependence.
- This spectral dependence can be used to detect the electric field intensity near the graphene layer (at a distance of about 2 Å).

3. **Experimental Results and Analysis**:
- The experimental results show that the photocurrent exhibits a strong resonance phenomenon in the frequency range within the reststrahl band, which is related to the dielectric constant characteristics of the SiC substrate.
- By analyzing the spectral behavior of the photocurrent, the author finds that the experimental results can be well described by the macroscopic Fresnel formula, although there are some quantitative differences.
- The results indicate that by appropriately selecting the spectral range and substrate material, the nonlinear optical and photoelectric phenomena in two - dimensional crystals and other atomic - scale structures can be greatly enhanced.

4. **Conclusions and Application Prospects**:
- This research provides a new method to detect the electric field at the atomic scale, which is very important for understanding physical phenomena at the nano - scale.
- In addition, the research also shows that by selecting suitable substrate materials, significantly enhanced optical and photoelectric effects can be achieved in two - dimensional materials and other nanostructures, which is of great significance for future device design and applications.

### Formula Summary

- **Photocurrent Density Formula**:
\[
j_{\text{PDE}}^y = T q_x (E_x E_y^* + E_x^* E_y) + T' q_x i (E_y E_x^* - E_x E_y^*)
\]
\[
j_{\text{PGE}}^y = \chi (E_z E_y^* + E_y E_z^*) + \gamma i (E_z E_y^* - E_y E_z^*)
\]

- **Electric Field Component Formula**:
\[
E_x = t_p E_0^p (n + i\kappa) \Xi, \quad E_y = t_s E_0^s
\]
\[
E_z^{\text{in}} = -t_p E_0^p \sin \theta_0 \Xi, \quad E_z^{\text{out}} = \epsilon E_z^{\text{in}}
\]

- **Complex Dielectric Function**:
\[
\epsilon(\omega) = \epsilon_\infty + \frac{\epsilon_0 - \epsilon_\infty}{1 - (\omega / \omega_{TO})^2 - i \omega \Gamma / \omega_{TO}^2}
\]

By combining these formulas and experimental data, the author successfully explains the spectral behavior of the photocurrent and shows its potential for detecting electromagnetic fields at the atomic scale.