Microwave properties of Yttrium Vanadate at cryogenic temperatures

Mohan V. Jacob,Janina E. Mazierska,Jerzy Krupka,Dimitri O. Ledenyov,Seiichi Takeuchi

DOI: https://doi.org/10.48550/arXiv.1209.5255

2012-09-24

Abstract:Yttrium Vanadate (YVO4) is a birefringent crystal material used in optical isolators and circulators with potentials for application in cryogenic microwave devices. As microwave properties of the YVO4 are not known, we measured the complex permittivity at the frequency of 25 GHz, using the Hakki-Coleman dielectric resonator technique in the temperature range from 13 K to 80 K. The real part of relative permittivity of YVO4 turned out to be similar to that of Sapphire - one of popular dielectric materials, used at microwave frequencies. The measured loss tangent tang {\delta} of the YVO4 was of the order of 10^(-6) at cryogenic temperatures. As Yttrium Vanadate (YVO4) is easy to synthesis and machine, it may replace the expensive Sapphire in some microwave applications.

Materials Science,Instrumentation and Detectors

What problem does this paper attempt to address?

The problem that this paper attempts to solve is: **Measure the microwave characteristics of yttrium vanadate (YVO₄) in a low - temperature environment, especially its complex permittivity and loss tangent value**. Since YVO₄ has been fully studied at optical frequencies, but the characteristic data at microwave frequencies are very limited, the researchers filled this gap in the field by accurately measuring its dielectric properties in the frequency of 25 GHz and the temperature range from 13 K to 80 K.

### Specific problems include:
1. **Real part of the dielectric constant ($\epsilon_r$)**: The researchers hope to determine the relative dielectric constant of YVO₄ under low - temperature conditions and compare it with known materials such as sapphire.
2. **Loss tangent ($\tan \delta$)**: The researchers hope to evaluate the loss characteristics of YVO₄ at low temperatures by measuring the loss tangent, which is crucial for microwave applications.
3. **Potential applications of the material**: By comparing the performance of YVO₄ with other commonly used microwave materials (such as sapphire), explore whether YVO₄ can be used as a low - cost alternative material in low - temperature microwave devices.

### Measurement methods:
- Use the Hakki - Coleman dielectric resonator technique, with the help of superconducting end plates, to ensure high - precision measurement results.
- Adopt the multi - frequency transmission mode Q - factor (TMFQ) method to process data, in order to improve the accuracy and reliability of calculations.

### Main findings:
- The relative dielectric constant $\epsilon_r$ of YVO₄ is approximately 9.31 to 9.32 in the range of 13 K to 80 K, which is similar to the dielectric constant of sapphire.
- The loss tangent $\tan \delta$ increases from $2.265\times10^{-6}$ to $5.1\times10^{-6}$ in the same temperature range, indicating that YVO₄ has very low - loss characteristics at low temperatures.

These findings suggest that YVO₄ has potential not only in optical applications but also may become an effective alternative material to sapphire in low - temperature microwave circuits.