Abstract:Van-der-Waals materials have been shown to support numerous exotic polaritonic phenomena originating from their layered structures and associated vibrational and electronic properties. This includes emergent polaritonic phenomena, including hyperbolicity and exciton-polariton formation. However, many van-der-Waals materials' unique properties are most prominent at cryogenic temperatures. This presents a particular challenge for polaritonics research, as reliable optical constant data is required for understanding light-matter coupling. For infrared polaritonics (3-100um), the small size of exfoliated flakes makes conventional ellipsometry impossible. This paper presents a cryogenic Fourier transform infrared microscope design constructed entirely from off-the-shelf components and fitting procedures for determining optical constants. We use this microscope to present the first temperature-dependent characterization of the optical properties of hexagonal boron nitride grown with isotopically pure boron. We show that Fabry Perot-type resonances close to the transverse optical phonon show the key temperature-dependent tuning of several parameters. Our full analysis of the infrared dielectric function shows small but significant tuning of the optical constants, which is highly consistent with Raman data from the literature. We then use this dielectric data to perform and analyze the polariton propagation properties, which agree extremely well with published cryogenic scattering-type nearfield microscopy results. In addition to the insights gained into hyperbolic polaritons in hBN, our paper represents a transferable framework for characterizing exfoliated infrared polaritonic materials and other infrared devices. This could accelerate discoveries in other material systems, especially those that are spatially inhomogeneous or cannot be prepared as large single crystals.

What problem does this paper attempt to address?

The paper aims to address the following issues: 1. **Characterization of Optical and Polariton Properties of Van der Waals Materials at Low Temperatures**: Van der Waals materials exhibit unique optical and polariton properties under low-temperature conditions, but these properties require precise optical constant data to understand the coupling between light and matter. Since the wavelength of infrared polaritons (3-100 μm) is comparable to the size of the materials, traditional methods such as ellipsometry cannot be applied to small van der Waals materials. 2. **Design of a Low-Temperature Fourier Transform Infrared Microscope**: A design scheme for a low-temperature Fourier transform infrared microscope based on a commercial infrared spectrometer and off-the-shelf components is proposed to achieve low-temperature spectral measurements of 2D van der Waals materials in the mid-infrared range. 3. **Extraction of Temperature-Dependent Optical Constants**: Using this microscope, the infrared dielectric function of isotopically enriched hexagonal boron nitride (hBN) was measured at different temperatures, and the changes in its temperature-dependent parameters were analyzed. The optical constants of hBN were determined through fitting methods, and the consistency and accuracy of the results were verified. 4. **Study of Polariton Propagation Characteristics**: Based on the extracted dielectric function data, the dispersion relation, mode quality factor, and loss rate of hyperbolic polaritons in hBN were further analyzed. These were compared with existing experimental results to verify the changes in polariton properties under low-temperature conditions. In summary, this paper is dedicated to developing a novel low-temperature infrared microscopy technique to accurately measure the optical properties of van der Waals materials under low-temperature conditions and to explore their impact on polariton behavior. This method is not only applicable to hexagonal boron nitride but can also be extended to the study of other van der Waals materials with phase transitions, free electron plasmas, and other optical properties.

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Unraveling Optical Polarization at Deep Microscopic Scales in Crystalline Materials

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