Abstract:A new way in electron beam emittance measurement with Cerenkov radiation "double imaging" method is proposed in this paper. In the standard emittance measurements with optical diagnostics such as Cerenkov radiation, OTR (Optical Transition Radiation), fluorescence screen or BMP (beam profile monitor) etc., the emittance is indirectly calculated through quadrupole-scanning technique, with the prior ssumption that the beam phase space density distribution is ellipse, which will certainly induce systematic error when the beam profile is quite irregular or the space-charge effects can not be omitted. In proposed method, the Cerenkov radiation pass through a 1-meter focal-length thin convex lens, and a CCD camera is used to capture two images of Cerenkov radiation at the focal plane and at the image plane of the lens respectively. Then, with image processing technique, we acquire the angular divergence information of the electron beam from the image of the focal plane and the radial distribution information from the image of the image plane, which we call Cerenkov radiation "double imaging" method. Therefore, the emittance can be directly attained according to the definition of the RMS emittance. By this method, we can measure the actual phase space distributions without making any prior assumptions about the density distributions. Compared with other general measurements, this "double imaging" method has advantages of simpler equipment, higher precision and wider application. This paper also presents the computer simulation results of emittance measurement on the DC-SC ( DC-Superconducting) photocathode injector of PKU-SCAF (Peking University Superconducting Accelerator Facility) being built at Peking University.

Single shot emittance measurement using Optical Transition Radiation

Research of Optical Transition Radiation on Intense Electron-Beam Diagnostics

Single Shot Transverse Emittance Measurement of multi-MeV Electron Beams Using a Long Pepper-Pot

A New Measurement Of Electron Beam Emittance With Cerenkov Radiation "Double Imaging" Method

Theoretical Considerations on Imaging of Micron Size Electron Beam with Optical Transition Radiation

Electron beam profile imaging in the presence of coherent optical radiation effects

Feasibility of OTR imaging of non-relativistic ions at GSI

Generation and Measurement of Sub-Micrometer Relativistic Electron Beams

A Resonant Cavity for Single-Shot Emittance Measurement

Multislit-Based Emittance Measurement of Electron Beam from a Photocathode Radio-Frequency Gun

Demonstration of Autonomous Emittance Characterization at the Argonne Wakefield Accelerator

Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance

Emittance Measurement along Transport Beam Line for Laser Driven Protons

Imaging of High-Energy Electron Beam Profile with Optical Diffraction Radiation

Multiple Parameter Characterizations for Electron Beam with Diffraction Radiation

Resolution of Transverse Electron Beam Measurements Using Optical Transition Radiation

A PROPOSAL FOR THE MEASUREMENT OF THE REAL EMITTANCE OF THE BEAM IN CYCLIC ACCELERATORS

Applying Fully Convolutional Networks for Beam Profile and Emittance Measurements

Thermal Emittance Isolation by Cathode Retraction

Calculation of the effect of slit size on emittance measurements made by a two-slit scanner

Single shot cathode transverse momentum imaging in high brightness photoinjectors