Abstract:X-ray photoelectron spectroscopy (XPS) is one of the most powerful techniques to quantitatively analyze the chemical composition and electronic structure of surfaces and interfaces in a non-destructive fashion. Extending this technique into the time domain has the exciting potential to shed new light on electronic and chemical dynamics at surfaces by revealing transient charge configurations with element- and site-specificity. Here, we describe prospects and challenges that are associated with the implementation of picosecond and femtosecond time-resolved X-ray photoelectron spectroscopy at third-generation synchrotrons and X-ray free-electron lasers, respectively. In particular, we discuss a series of laser-pump/X-ray-probe photoemission experiments performed on semiconductor surfaces, molecule-semiconductor interfaces, and films of semiconductor nanoparticles that demonstrate the high sensitivity of time-resolved XPS to light-induced charge carrier generation, diffusion and recombination within the space charge layers of these materials. Employing the showcase example of photo-induced electronic dynamics in a dye-sensitized semiconductor system, we highlight the unique possibility to probe heterogeneous charge transfer dynamics from both sides of an interface, i.e., from the perspective of the molecular electron donor and the semiconductor acceptor, simultaneously. Such capabilities will be crucial to improve our microscopic understanding of interfacial charge redistribution and associated chemical dynamics, which are at the heart of emerging energy conversion, solar fuel generation, and energy storage technologies.

Electron Imaging of Nanoscale Charge Distributions Induced by Femtosecond Light Pulses

Electron Imaging of Nanoscale Charge Distributions Induced by Femtosecond Light Pulses

Nanoscale Imaging of Surface Topography and Reactivity with the Scanning Electrochemical Microscope

Nanosecond electron imaging of transient electric fields and material response

Imaging built-in electric fields and light matter by Fourier-precession TEM

Electron-beam-induced charging of an Al2O3 nanotip studied using off-axis electron holography

Ultrafast Electron Microscopy of Nanoscale Charge Dynamics in Semiconductors

Visualizing Standing Light Waves in Continuous-Beam Transmission Electron Microscopy

Femtosecond single- to few-electron point-projection microscopy for nanoscale dynamic imaging

Imaging Simulation of Charged Nanowires in TEM with Large Defocus Distance.

Attosecond field emission

Self-Heterodyne Diffractive Imaging of Ultrafast Electron Dynamics Monitored by Single-Electron Pulses

Coherent femtosecond low-energy single-electron pulses for time-resolved diffraction and imaging: A numerical study

Time-resolved X-ray photoelectron spectroscopy techniques for the study of interfacial charge dynamics

Probing Transient Localized Electromagnetic Fields Using Low-Energy Point-Projection Electron Microscopy

Photon-Induced Near-Field Electron Microscopy of Nanostructured Metallic Films and Membranes

Nanoscale-Femtosecond Imaging of Evanescent Surface Plasmons on Silver Film by Photon-Induced Near-Field Electron Microscopy

Attosecond electron microscopy by free-electron homodyne detection

Imaging ultrafast carrier transport in nanoscale devices using femtosecond photocurrent microscopy

Imaging Coherent Electron Flow

Tracking Surface Charge Dynamics on Single Nanoparticles