Operando double‐edge high‐resolution X‐ray absorption spectroscopy study of BiVO4 photoanodes

Alberto Piccioni,Jagadesh Kopula Kesavan,Lucia Amidani,Raffaello Mazzaro,Serena Berardi,Stefano Caramori,Luca Pasquini,Federico Boscherini
DOI: https://doi.org/10.1107/s1600577524002741
IF: 2.557
2024-04-16
Journal of Synchrotron Radiation
Abstract:Operando high‐resolution X‐ray absorption spectroscopy of BiVO4 photoanodes was performed in an electrochemical cell at both cation absorption edges. Small but significant variations of the spectra induced by electrochemical polarization were detected which were interpreted in terms of changes in the occupation of electronic states.High energy resolution fluorescence detected X‐ray absorption spectroscopy is a powerful method for probing the electronic structure of functional materials. The X‐ray penetration depth and photon‐in/photon‐out nature of the method allow operando experiments to be performed, in particular in electrochemical cells. Here, operando high‐resolution X‐ray absorption measurements of a BiVO4 photoanode are reported, simultaneously probing the local electronic states of both cations. Small but significant variations of the spectral lineshapes induced by the applied potential were observed and an explanation in terms of the occupation of electronic states at or near the band edges is proposed.
optics,physics, applied,instruments & instrumentation
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