Abstract:Accurately characterizing the internal porosity rate of thermal barrier coatings (TBCs) was essential for prolonging their service life. This work concentrated on atmospheric plasma spray (APS)-prepared TBCs and proposed the utilization of terahertz non-destructive detection technology to evaluate their internal porosity rate. The internal porosity rates were ascertained through a metallographic analysis and scanning electron microscopy (SEM), followed by the reconstruction of the TBC model using a four-parameter method. Terahertz time-domain simulation data corresponding to various porosity rates were generated employing the time-domain finite difference method. In simulating actual test signals, white noise with a signal-to-noise ratio of 10 dB was introduced, and various wavelet transforms were utilized for denoising purposes. The effectiveness of different signal processing techniques in mitigating noise was compared to extract key features associated with porosity. To address dimensionality challenges and further enhance model performance, kernel principal component analysis (kPCA) was employed for data processing. To tackle issues related to limited sample sizes, this work proposed to use the Siamese neural network (SNN) and generative adversarial network (GAN) algorithms to solve this challenge in order to improve the generalization ability and detection accuracy of the model. The efficacy of the constructed model was assessed using multiple evaluation metrics; the results indicate that the novel hybrid WT-kPCA-GAN model achieves a prediction accuracy exceeding 0.9 while demonstrating lower error rates and superior predictive performance overall. Ultimately, this work presented an innovative, convenient, non-destructive online approach that was safe and highly precise for measuring the porosity rate of TBCs, particularly in scenarios involving small sample sizes facilitating assessments regarding their service life.

Terahertz single-scan extraction of the dynamic information in a layered deposition

Hidden-information extraction from layered structures through terahertz imaging down to ultralow SNR

Extraction of Material Parameters of a Bi-Layer Structure Using Terahertz Time-Domain Spectroscopy

THz Time-Domain Spectroscopy Technology

In-Situ Thickness Measurement of Thin Deposited Layer on the Silicon Wafer Using Multi-Reflected Terahertz Electro-Magnetic Wave

Terahertz nondestructive quantitative characterization for layer thickness based on sparse representation method

Simultaneously Measuring Thickness, Density, Velocity and Attenuation of Thin Layers Using V(z,t) Data from Time-Resolved Acoustic Microscopy.

Simultaneous Measurement of Local Longitudinal and Transverse Wave Velocities, Attenuation, Density, and Thickness of Films by Using Point-Focus Ultrasonic Spectroscopy

Simultaneous Thickness, Velocity, Density, and Attenuation Measurement of a Thin Layer by Time-Resolved Acoustic Microscopy

Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement

THz-TDS Reflection Measurement of Coating Thicknesses at Non-Perpendicular Incidence: Experiment and Simulation

Nondestructive Thickness Measurement of Thermal Barrier Coatings for Turbine Blades by Terahertz Time Domain Spectroscopy

Simultaneous Measurement of Elastic Moduli, Attenuation, Density, and Thickness of a Layer by Ultrasonic Spectroscopy Using Point-Focus Transducer

Online terahertz thickness determination of sub-wavelength layers at kilohertz measurement rates

Non-destructive thickness measurement of thermal barrier coatings using terahertz radiation

A New Method for Measuring Multilayer Thickness Using a Chromatic Confocal Sensor

Terahertz Non-Destructive Testing of Porosity in Multi-Layer Thermal Barrier Coatings Based on Small-Sample Data

Optical and Geometrical Properties from Terahertz Time-Domain Spectroscopy Data

THz time-domain spectroscopic investigations of thin films

Terahertz PT Technology for Measurement of Multiphase Flow and Its Infrared Simulation

Determination of the Multiple Local Properties of Thin Layer with High Lateral Resolution by Scanning Acoustic Microscopy.