Transmission electron microscopy characterizations of local amorphization of single crystal silicon by nanosecond pulsed laser direct writing

Lanh Trinh,Xinya Wang,Xiang Zhang,Sajed Hosseini-Zavareh,Aofei Mao,Xiaoming Yu,Shuting Lei,Bai Cui
DOI: https://doi.org/10.1002/adem.202301377
IF: 3.6
2023-11-29
Advanced Engineering Materials
Abstract:The concept for fabrication of waveguides by an in‐volume laser direct writing in single‐crystal silicon was explored using a nanosecond pulse laser. The key innovation of this technology relies on the generation of amorphous silicon, which has a higher refractive index than that of crystalline silicon. In this study, transmission electron microscopy (TEM) together with selected area electron diffraction (SAED) and high‐resolution TEM (HRTEM) characterizations were used to better understand the microstructural evolutions. TEM images revealed the core‐shell structures, while SAED patterns and HRTEM directly observed the presence of amorphous silicon in the core surrounded by a crystalline silicon shell. With a lower laser scanning speed, higher density of defects yet less amorphous silicon was formed by laser direct writing. This article is protected by copyright. All rights reserved.
materials science, multidisciplinary
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