Abstract:Cycling stability of the photochromic effect in rare-earth oxyhydride thin films is of great importance for long-term applications such as smart windows. However, an increasingly slower bleaching rate upon photochromic cycling was found in yttrium oxyhydride thin films; the origin of this memory effect is yet unclear. In this work, the microstructural changes under six photodarkening-bleaching cycles in YHxOy and GdHxOy thin films are investigated by in situ illumination Doppler broadening positron annihilation spectroscopy, complemented by positron annihilation lifetime spectroscopy (PALS) investigations on YHxOy films before and after one cycle. For the first three cycles, the Doppler broadening S parameter after bleaching increases systematically with photodarkening-bleaching cycle, and correlates with the bleaching time constant extracted from optical transmittance measurements. This suggests that the microstructural evolution that leads to progressively slower bleaching involves vacancy creation and agglomeration. PALS suggests that during a photodarkening-bleaching cycle, divacancies are formed that are possibly composed of illumination-induced hydrogen vacancies and preexisting yttrium monovacancies, and vacancy clusters grow, which might be due to local removal of hydrogen. If bleaching is a diffusion-related process, the formed vacancy defects induced by illumination might affect the diffusion time by reducing the diffusion coefficient. Hydrogen loss could also be a key factor in the reduced bleaching kinetics. Other microstructural origins including domain growth, or formation of OH− hydroxide groups, are also discussed with respect to the slower bleaching kinetics. During the fourth to sixth photodarkening-bleaching cycle, reversible shifts in the Doppler S and W parameters are seen that are consistent with the reversible formation of metallic-like domains, previously proposed as a key factor in the mechanism for the photochromic effect. https://doi.org/10.1103/PhysRevMaterials.8.045201 ©2024 American Physical Society

Chemical state and atomic structure in stoichiovariants photochromic oxidized yttrium hydride thin films

Optical properties of oxygen-containing yttrium hydride thin films during and after the deposition

New insights into the photochromic mechanism in oxygen-containing yttrium hydride thin films: an optical perspective

Evidence of local structural distortions and subtle thermal disorder in transparent photochromic yttrium oxyhydride

Light-induced breathing in photochromic yttrium oxy-hydrides

Experimental and Theoretical Investigation of Gadolinium Oxyhydride (GdHO) Thin Films: Optical, Photocatalytic, and Electronic Properties

Synthesis and $\textit{in-situ}$ characterization of photochromic yttrium oxyhydride grown by reactive $e^-$-beam evaporation

Correlating chemical composition and optical properties of photochromic rare-earth oxy-hydrides using ion beam analysis

A new thin film photochromic material: Oxygen-containing yttrium hydride

Photochromic response of encapsulated oxygen-containing yttrium hydride thin films

Reactive pulsed direct current magnetron sputtering deposition of semiconducting yttrium oxide thin film in ultralow oxygen atmosphere: A spectroscopic and structural investigation of growth dynamics

YHO, an Air-Stable Ionic Hydride

Memory effect in photochromic rare-earth oxyhydride thin films studied by in situ positron annihilation spectroscopy upon photodarkening-bleaching cycling

High-Resolution Electronic Spectra of Yttrium Oxide (yo): the D-2 Sigma(+)-X-2 Sigma+ Transition

From zirconia to yttria: Sampling the YSZ phase diagram using sputter-deposited thin films

Structural and compositional characterization of yttria-stabilized zirconia: evidence of surface-stabilized, low-valence metal species

Influence of Crystal Structure, Encapsulation, and Annealing on Photochromism in Nd Oxyhydride Thin Films

Monodentate Alkoxy/Aryloxy Anchored Yttrium Dihydrides; Anticipated Outcomes and Surprises

Transparent yttrium hydride thin films prepared by reactive sputtering

X-ray photoelectron spectroscopy and NIR self-quenching emission behavior in Ho 3+ doped YOF and V-YOF

Study on Reactive Sputtering of Yttrium Oxide: Process and Thin Film Properties