Abstract:Divergent-beam X-ray photography of single crystals by transmission can be used to study the ‘extinction’, that is, the diminution of the transmitted radiation that takes place at the Bragg reflexion angles. The intensity and geometry of the absorption lines observed give useful information about the texture of the crystal. Divergent beam photographs have shown that many crystals of organic compounds are unexpectedly perfect, and that sudden cooling to liquid-air temperatures will increase the mosaic character of their structure by an important factor and make them more suitable for structural analysis by the usual methods. Type I diamonds, and natural ice even near to its melting-point, are also found to possess a high degree of perfection, which cannot be removed by liquid-air treatment. The divergent beam method may be used for the determination of orientation, but it is important that the wave-length of X-rays employed should be correctly related to the size and nature of the crystal. In certain favourable cases it is possible to make precision measurements of lattice constant or of wave-length from divergent beam photographs, without the use of any kind of precision apparatus. By such means it has been shown that the C—C distance in individual diamonds varies from 1541.53(± 0-02) to 1541.27X, (1.54465-1-54440A), a difference presumably due to varying impurity content. Using diamond and a brass anticathode, the Zn Ka 1 wave-length, relative to Cu K Ka 1 as 1537.40X, is found to be 1432.21 ( ± 0-04) X. Temperature control would improve the accuracy of this measurement, which is, however, in good agreement with the latest value obtained by orthodox precision methods.

Influence of the reflectivity of a crystal on the angular distribution of diffracted transition radiation of relativistic electrons

Influence of Transmission Characteristics of Beam Deflector on Orienting Accuracy

The limits of volume reflection in bent crystals

Atomistic modelling of electron propagation and radiation emission in oriented bent ultra-thin Si and Ge crystals

Radiation of photons in process of charge particle volume reflection in bent single crystal

Simulation study of electron beam divergence and its distribution measurement

Double-slit X-ray dynamical diffraction in curved crystals

Dynamic diffraction of thermal neutrons in crystals with continuous deformation field

Time Dependence of the Intensity of Diffracted Radiation Produced by a Relativistic Particle Passing through a Natural or Photonic Crystal

All-atom relativistic molecular dynamics simulations of channeling and radiation processes in oriented crystals

Dynamical Diffraction Effect in a Curved Multi-Plate Crystal Cavity.

Dynamical and kinematical X‐ray diffraction in a bent crystal

Treatment for the Intensity Problem Ofn-Beam Kinematical Reflections in a Dynamical Formalism

“Volume reflection” of high-energy charged particles in quasi-channeling states in bent crystals

Use of parametric X-ray radiation of electrons in crystals to determine the parameters of imaging-plates

Divergent-beam X-ray photography of crystals

Simulation of Deflection and Photon Emission of Ultra-Relativistic Electrons and Positrons in a Quasi-Mosaic Bent Silicon Crystal

On the Theory of Diffraction of Limited Synchrotron Radiation Beams in Single Crystal in the Laue Case

Effects of Bulk Resonance Diffraction on Inelastic Scattering of High-Energy Electrons by Crystals

Measurement of the Reflection Curve of Crystals Used in the Monochromator of X-ray Diffraction Beamline at NSRL

Polarization, transverse shifts, and angular momentum conservation laws in partial reflection and refraction of an electromagnetic wave packet