Crystal Cavity Resonance for Hard X Rays: A Diffraction Experiment
S. -L. Chang,Yu. P. Stetsko,M. -T. Tang,Y. -R. Lee,W. -H. Sun,M. Yabashi,T. Ishikawa,H. -H. Wu,B. -Y. Shew,Y. -H. Lin,T. -T. Kuo,K. Tamasaku,D. Miwa,S. -Y. Chen,Y. -Y. Chang,J. -T. Shy
DOI: https://doi.org/10.1103/physrevb.74.134111
2006-01-01
Abstract:We report the details of the recent x-ray back diffraction experiments, in which interference fringes due to x-ray cavity resonance are unambiguously observed. The Fabry-Perot type cavities, the tested crystal devices of reflectivity R similar or equal to 0.5 and finesse F similar or equal to 2.3, consist of monolithic two-plate and eight-plate silicon crystals. They were prepared by using x-ray lithographic techniques. The thicknesses of the crystal plates and the gaps between the two adjacent plates are a few tens to hundreds mu m. The (12 4 0) back reflection and synchrotron x-radiation of energy resolution Delta E=0.36 meV at 14.4388 keV are employed. Interference fringes in angle- and photon-energy scans for two-plate and eight-plate cavities are shown. Considerations on the temporal and spatial coherence for observable resonance interference fringes using synchrotron x-rays are presented. The details about the accompanied simultaneous 24-beam diffraction in relation to x-ray photon energy are also described.