Narrow-band pulsed electron source based on near-threshold photoionization of Cs in a magneto-optical trap

O. Fedchenko,S. Chernov,G. Schönhense,R. Hahn,D. Comparat
DOI: https://doi.org/10.1103/PhysRevA.101.013424
2020-01-16
Abstract:The newly developed method of time-of-flight (TOF) momentum microscopy was used to analyze the cold electron emission from a Cs three-dimensional magneto-optical trap (MOT). Three-step resonant photoionization was implemented via two intermediate states ( pumped with an 852-nm laser and ... [Phys. Rev. A 101, 013424] Published Wed Jan 15, 2020
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