Abstract:Three-dimensional elemental mapping in atom probe microscopy provides invaluable insights into the structure and composition of interfaces in materials. Quasi-atomic resolution facilitates access to the solute decoration of grain boundaries, advancing the knowledge on local segregation and depletion phenomena. More recent developments unlocked three-dimensional mapping of the interfacial excess across grain boundaries. Such detailed understanding of the local structure and composition of these interfaces enabled advancements in processing methods and material development. However, many engineering alloys, such as Ni-based superalloys, have much more complex microstructures with various solutes and precipitates in close proximity to grain boundaries. The complex interaction of grain boundary segregation and grain boundary precipitates requires precise compositional control. However, abrupt changes in solute solubility across phase boundaries obscure the interfacial excess in proximity to grain boundaries. Therefore, this study provides a methodological framework of the quantitative characterization of phase boundaries in proximity to grain boundaries using atom probe microscopy. The detailed mass spectrum ranging of MC, M23C6, and M6C carbides is explored in order to achieve satisfactory compositional information. Proximity histograms and correlating concentration difference profiles determine the interface location, where a Gibbs dividing surface is not accessible. This enables reliable direct calculation of the interfacial excess across phase boundaries. Intuitively interpretable and quantitative 'interface plots' are introduced, and showcased for phase boundaries between γ-matrix, γ' precipitates, GB-γ', MC, M23C6, and M6C carbides. The presented framework advances access to the local composition in proximity to grain boundaries and may be applicable to other engineering alloys or materials with functional properties.

Direct Measurement of 2D and 3D Interprecipitate Distance Distributions from Atom-Probe Tomographic Reconstructions

Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram

Parameter free quantitative analysis of atom probe data by correlation functions: Application to the precipitation in Al-Zn-Mg-Cu

High-speed Astigmatic Dual-Beam Interferometric Particle Imaging for Direct Depth Displacement and Velocity Measurement of Metal Droplet

3D Locating and Sizing of Volumetric Metal Droplets with Astigmatic Dual-Beam Interferometric Particle Imaging at Panoramic Scattering Angle

Measurements of angular distributions of sputtered material as a new tool for surface-segregation studies: Segregation in CuPt alloys

Correlating grain boundary character and composition in 3-dimensions using 4D-scanning precession electron diffraction and atom probe tomography

A Combinatorial Approach to Reliable Quantitative Analysis of Small Nano-Sized Precipitates: A Case Study with α' Precipitates in Fe-20 at% Cr Alloy

Characterization of Carbide Precipitation in Low-Carbon Martensitic Steels Using an Ultrawide Field-of-View 3D Atom Probe

Interfacial excess of solutes across phase boundaries using atom probe microscopy

Quantitative three-dimensional imaging of chemical short-range order via machine learning enhanced atom probe tomography

Quantitative powder diffraction using a (2+3) surface diffractometer and an area detector

Three-dimensional structure from single two-dimensional diffraction intensity measurement

Quantifying the atomic neighbourhoods in complex concentrated alloys

Probing Planar Defects in Nanoparticle Superlattices by 3d Small-Angle Electron Diffraction Tomography and Real Space Imaging

Quantification of Dislocation-Precipitate Interactions

Atomic-scale Chemical Imaging and Quantification of Metallic Alloy Structures by Energy-Dispersive X-ray Spectroscopy

Three-Dimensional Chemical Analysis of Tungsten Probes by Energy Dispersive X-Ray Nanotomography

Combined electron beam imaging and ab initio modeling of T1 precipitates in Al–Li–Cu alloys

On the measurement by EDX of diffusion profiles of Ni/Cu assemblies

Quantifying short-range order using atom probe tomography