Measurements of angular distributions of sputtered material as a new tool for surface-segregation studies: Segregation in CuPt alloys

H.H. Andersen,V. Chernysh,B. Stenum,T. Sørensen,H.J. Whitlow
DOI: https://doi.org/10.1016/0039-6028(82)90127-3
IF: 1.9
1982-12-01
Surface Science
Abstract:The angular distribution of copper and platinum sputtered by argon ions from polycrystalline CuPt targets at 77 K has been measured by a collection technique. The argon-ion energy has been varied from 1.25 to 320 keV. For bombardment energies above 20 keV, differences in the angular distributions for the two elements indicate a strong copper segregation to the surface during bombardment.
chemistry, physical,physics, condensed matter
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