Abstract:Emerging topological semimetals offer promise of realizing topological electronics enabled by terahertz (THz) current persistent against impurity scattering. Yet most fundamental issues remain on how to image nanoscale conductivity inhomogeneity. Here we show noninvasive and contactless conductivity mapping at THz-nm limit of electronic heterogeneity and nanostrip junctions in a Dirac material ZrTe<sub>5</sub>. A clear Dirac Fermion density transition, manifested as the exclusive THz conductivity contrast, is quantitatively analyzed and profiled on both sides of the junction. This also allows the determination of variable junction width of ∼25–220 nm, depending on the THz conductivity contrast of adjacent strips. The unique THz-nm contrast is absent in mid-infrared nano-imaging measurements since topological semimetals with small Fermi pockets exhibit a better matching of their plasma frequency and scattering rate to the THz spectral region. The first-principles calculations provide two compelling implications: the conductivity nanocontrast can be induced by a small anisotropic strain, even less than 0.5%, due to an extreme strain sensitivity in ZrTe<sub>5</sub>; A nanoscale topological phase transition is realized across some junctions induced by the strain, between strong topological insulators (TIs) and weak TIs/Dirac semimetals (DSMs).The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsphotonics.1c00216?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsphotonics.1c00216</a>.Further details of sample growth and THz scanning near-field optical microscopy and extra data (<a class="ext-link" href="/doi/suppl/10.1021/acsphotonics.1c00216/suppl_file/ph1c00216_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.

Nano-compositional imaging of the lanthanum silicide system at THz wavelengths

Probing Surface Evanescent Waves with an Ultra-High Sensitive Terahertz Near-Field Microscope

A Terahertz Confocal Microscope for Far-Field Thermal Radiation Detection and Near-Field Sub-Wavelength Imaging

Near-field infrared nanoscopic study of EUV- and e-beam-exposed hydrogen silsesquioxane photoresist

Nano-spectroscopy of excitons in atomically thin transition metal dichalcogenides

Terahertz Nanoimaging and Nanospectroscopy of Chalcogenide Phase-Change Materials

Imaging the nanoscale phase separation in vanadium dioxide thin films at terahertz frequencies

Spintronic terahertz metasurface emission characterized by scanning near-field nanoscopy

Terahertz Nano-Imaging with s-SNOM

A terahertz near-field nanoscopy revealing edge fringes with a fast and highly sensitive quantum-well photodetector

Probes for Ultrasensitive THz Nanoscopy

Laser THz emission nanoscopy and THz nanoscopy

Near-field terahertz probes with room-temperature nanodetectors for subwavelength resolution imaging

Super-resolution Hyper-Spectral Imaging for the Direct Visualization of Local Bandgap Heterogeneity

Near-field Raman Spectral Measurement of Monocrystalline Silicon by Apertureless SNOM in Feflection Geometry

Terahertz Nano-Imaging of Electronic Strip Heterogeneity in a Dirac Semimetal

Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

Sub-terahertz scanning near-field optical microscope using a quartz tuning fork based probe

Imaging the Terahertz Nanoscale Conductivity of Polycrystalline CsPbBr3 Perovskite Thin Films

Nanoscale imaging of phonon dynamics by electron microscopy

Anomalous contrast in broadband THz near-field imaging of gold microstructures