Abstract:Leveraging from thickness control methodology, vertical ferroelectric polarization switching is recorded on a 6 nm thick specimen probed by a piezoresponse force microscopy. The ferroelectric origin is uncovered by first‐principles density‐functional theory calculations. Bi2O2Se‐based field‐effect transistor demonstrated an unprecedented current on–off ratio of 108 and carrier mobility of 131 cm2 V−1 s−1. This work manifests the feasibility of 2D Bi2O2Se for next‐generation electronics. The amelioration of atomically thin ferroelectric materials is imperative for next‐generation outperformed two‐dimensional (2D) electronics, which is elusive by their bulk counterparts. These remarkable materials' ferroelectric and piezoelectric features are the fundamental urges in optoelectronics, electronics, and energy harvesting. In this work, 2D ferroelectric Bi2O2Se flakes have been synthesized using a modified chemical vapor deposition technique. The 6 nm thick Bi2O2Se flake provides a robust ferroelectric switching under an applied voltage of ±10 V by piezoresponse force microscopy, further confirmed by first principles. Leveraging the successful growth, the high‐quality Bi2O2Se flakes permit the fabrication of a field‐effect transistor (FET) with state‐of‐the‐art performance. The FET device rewards a high current on–off ratio of 108 and field effect mobility of almost 131 cm2 V−1 s−1, owing to the small carrier effective mass of 0.2 m0. Combined, the electric field‐induced local polarization of ferroelectric switching and unprecedented device performance of Bi2O2Se semiconductors are certified for their utilization in advanced nanoelectronics and miniaturization of multifunctional devices with multifunctionalities.

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