Abstract:Nanoscale processor designs pose new challenges not encountered in the world of conventional CMOS designs and manufacturing. Nanoscale devices based on crossed semiconductor nanowires (NWs) have promising characteristics in addition to providing great density advantage over conventional CMOS devices. This density advantage could, however, be easily lost when assembled into nanoscale systems and especially after techniques dealing with high defect rates and manufacturing related layout/doping constraints are incorporated. Most conventional defect/fault-tolerance techniques are not suitable in nanoscale designs because they are designed for very small defect rates and assume arbitrary layouts for required circuits. Reconfigurable approaches face fundamental challenges including a complex interface. between the micro and nano components required for programming. In this paper, we present our work on adding fault-tolerance to all components of a processor implemented on a 2-D semiconductor NW fabric called nanoscale application specific integrated circuits (NASICs). We combine and explore structural redundancy, built-in nanoscale error correcting circuitry, and system-level redundancy techniques and adapt the techniques to the NASIC fabric. Faulty signals caused by defects and other error sources are masked on-the-fly at various levels of granularity. Faults can be masked at up to 15% rates, while maintaining a 7 x density advantage compared to an equivalent CMOS processor at projected 18-mn technology. Detailed analysis of yield, density, and area tradeoffs is provided for different error sources and fault distributions.

A DSP nanosystem with defect tolerance

Combining Circuit Level and System Level Techniques for Defect-Tolerant Nanoscale Architectures

Fault-Tolerant Nanoscale Processors on Semiconductor Nanowire Grids.

Reliable Memristor-based Neuromorphic Design Using Variation- and Defect-Aware Training

Self-Healing Wire-Streaming Processors on 2-D Semiconductor Nanowire Fabrics

Defect-Tolerance Analysis of Fundamental Quantum-Dot Cellular Automata Devices

Research on Fault-tolerant Techniques Based on Interwoven Redundancy for Nanoscale Circuits

Wearout Tolerant Network Processing on Asymmetric Multi-core Processor

A 28-Nm 198.9-TOPS/W Fault-Tolerant Stochastic Computing Neural Network Processor

An efficient methodology to evaluate nanoscale circuit fault-tolerance performance based on belief propagation

Parallel Photoelectron Storage and Visual Preprocessing Based on Nanowire Defect Engineering for Image Degradation

Defect-Aware High-Level Synthesis Targeted at Reconfigurable Nanofabrics

Fault Tolerant Computing for Stream Dsp Applications Using Gals Multi-Core Processors

A Fast Extraction Algorithm for Defect-Free Subcrossbar in Nanoelectronic Crossbar.

A High Performance Fault Tolerant System for On-Board Signal Processing

Low-Overhead Defect-Adaptive Surface Code with Bandage-Like Super-Stabilizers

High performance parallel processing system based on dual port memories

A Fine-Grained/Coarse-Grained Heterogeneous Reconfigurable Dsp Architecture Based On Parallel Processing

An efficient modeling workflow for high-performance nanowire single-photon avalanche detector

A high reliability on-board parallel system based on multiple DSPs

Defects Mitigation in Resistive Crossbars for Analog Vector Matrix Multiplication