Abstract:Influence of structure and microstructure on the dielectric properties of single-phase solid solution of ZrO 2 –CeO 2 system with 80% CeO 2 has been investigated. Highly dense polycrystalline Ce 0.8 Zr 0.2 O 2 ceramic was synthesized through solid-state reaction route, and its cubic structure was verified through X-ray diffraction and Raman spectroscopy techniques. The compact grain morphology was validated through FESEM with grain size of ~9 μm. Dielectric properties of the Ce 0.8 Zr 0.2 O 2 were probed by applying ac electric field of different frequencies at variable temperatures. The measured dielectric constant of Ce 0.8 Zr 0.2 O 2 in the presence of applied ac field of 2 kHz frequency at 300 K is ~1819, is reduced to 27 with an increase in the frequency up to 2 MHz, which is a comparatively high dielectric constant than binary oxides. The high packing fraction of cubic structure of ZrO 2 –CeO 2 with 80% CeO 2 showed a small dielectric loss ( ). The interfacial polarization effect was confirmed by low-frequency dielectric dispersion in and . The large conductivity coupled with a relaxation phenomenon at higher temperatures is attributed to the shift from extended hopping to localized ionic transport. Ce 0.8 Zr 0.2 O 2 showed a negative coefficient of resistance validated through increasing ac conductivity with temperature. A high dielectric constant with small dielectric tangent loss achieved in cubic structured sample established its application in high-performance metal oxide semiconductor field effect transistor (MOSFET) devices along with the formation of advanced solid-electrolytes for solid oxide fuel cells.

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