Surmounting Erase-Operation Limit in Organic Charge-Trap Memories by Fine Tuning Electron Injection at Semiconductor/Heterobimetallic Electrode Contacts

Woo-Seok Kim,Chang-Hyun Kim,Jin-Hyuk Kwon,Min-Hoi Kim
DOI: https://doi.org/10.1021/acsami.4c17183
IF: 9.5
2024-12-13
ACS Applied Materials & Interfaces
Abstract:Heterobimetallic systems (HBS), known for their ability to facilitate the versatile design of surface workfunctions, offer significant potential as an electron-injection electrode layer for organic semiconductors. In this paper, we propose a universal and effective strategy to overcome the limitations of the erase operation in charge-trap memory with a small-bandgap organic semiconductor or diketopyrrolopyrrole-quaterthiophene-conjugated polymer (PDPP4T) by utilizing HBS-based source/drain (SD)...
materials science, multidisciplinary,nanoscience & nanotechnology
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