Electrophoretic deposition for improved trace element homogeneity in silica reference materials

Peter S. Boone,Sharee Harris,Christina Ramon,Jennifer Shusterman,Andrew J. Pascall,Tashi Parsons-Davis
DOI: https://doi.org/10.1016/j.matlet.2024.136089
IF: 3
2024-02-15
Materials Letters
Abstract:Spatially-resolved analysis requires homogeneous reference materials (RMs) to make reliable quantitative measurements. We previously developed an electrophoretic deposition (EPD) method for fabrication of glassy microanalytical RMs with superior platinum-group element homogeneity **[1], and now include further dopants. For 39 trace elements, we analyzed dopant homogeneity in sintered silica (SiO 2 ) samples consolidated either mechanically by die-pressing (DP) or by EPD. A set of EPD and DP samples was made from each of two nanoparticle feedstocks produced by variations of the Stöber process **[2]. Spatially-resolved dopant distribution was characterized in all samples by laser-ablation inductively-coupled plasma mass spectrometry (LA-ICP-MS). In both sample sets, homogeneity of most trace elements was substantially improved by EPD relative to their DP counterpart.
materials science, multidisciplinary,physics, applied
What problem does this paper attempt to address?