Comprehensive Application of XFEL Microcrystallography for Challenging Targets in Various Organic Compounds

Kiyofumi Takaba,Saori Maki-Yonekura,Ichiro Inoue,Kensuke Tono,Yasuhiro Fukuda,Yota Shiratori,Yiying Peng,Jumpei Morimoto,Satoru Inoue,Toshiki Higashino,Shinsuke Sando,Tatsuo Hasegawa,Makina Yabashi,Koji Yonekura
DOI: https://doi.org/10.1021/jacs.3c11523
IF: 15
2024-02-29
Journal of the American Chemical Society
Abstract:There is a growing demand for structure determination from small crystals, and the three-dimensional electron diffraction (3D ED) technique can be employed for this purpose. However, 3D ED has certain limitations related to the crystal thickness and data quality. We here present the application of serial X-ray crystallography (SX) with X-ray free electron lasers (XFELs) to small (a few μm or less) and thin (a few hundred nm or less) crystals of novel compounds dispersed on a substrate. For XFEL...
chemistry, multidisciplinary
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