Size effect of martensite substructure and interface structure in Ni-Mn-Ga-Gd thin film

Yiping Zheng,Jian Yao,Xiaoyang Yi,Zhiyong Gao
DOI: https://doi.org/10.1016/j.matchar.2024.114590
IF: 4.537
2024-12-05
Materials Characterization
Abstract:Ni 56 Mn 25 Ga 18.8 Gd 0.2 thin films were prepared by DC magnetron sputtering technique. Thin films with different grain sizes were obtained by adjusting the annealing process. Size effect of martensite substructure and interface structure in Ni-Mn-Ga-Gd thin were systematically investigated. In order to minimize the elastic strain energy, the micro-twins with periodic <2 5 ̄ > layers were generated in the grain size of 179 nm, leading to the formation of 7 M martensite. Geometric analysis shows that lattice constants of 7 M martensite can well satisfy the adaptive martensite formation theory. That means the (220) crystal plane of 7 M martensite can be regarded as the (202) crystal plane of NM martensite. A larger number of twin interface energy accumulates in the 7 M martensite, which makes it in an unstable state thermodynamically. With the increase of the grain sizes, the restriction of the grain boundary to the motion of twinning dislocation is weakened, leading to coarsening of micro-twins under the driving of excessive twin interface energy, and ultimately forming NM martensite with different thicknesses micro-twin substructures.
materials science, multidisciplinary,metallurgy & metallurgical engineering, characterization & testing
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