Abstract:Bragg interferometry (BI) is an imaging technique based on four-dimensional scanning electron microscopy (4D-STEM) wherein the intensities of select overlapping Bragg disks are fit or more qualitatively analyzed in the context of simple trigonometric equations to determine local stacking order. In 4D-STEM based approaches, the collection of full diffraction patterns at each real-space position of the scanning probe allows the use of precise virtual apertures much smaller and more variable in shape than those used in conventional dark field imaging, such that even buried interfaces marginally twisted from other layers can be targeted. A coarse-grained form of dark field ptychography, BI uses simple physically derived fitting functions to extract the average structure within the illumination region and is therefore viable over large fields of view. BI has shown a particular advantage for selectively investigating the interlayer stacking and associated moiré reconstruction of bilayer interfaces within complex multi-layered structures. This has enabled investigation of reconstruction and substrate effects in bilayers through encapsulating hexagonal boron nitride and of select bilayer interfaces within trilayer stacks. However, the technique can be improved to provide a greater spatial resolution and probe a wider range of twisted structures, for which current limitations on acquisition parameters can lead to large illumination regions and the computationally involved post-processing can fail. Here we analyze these limitations and the computational processing in greater depth, presenting a few methods for improvement over previous works, discussing potential areas for further expansion, and illustrating the current capabilities of this approach for extracting moiré-scale strain.

Moiré fringe imaging of heterostructures by scanning transmission electron microscopy

Moiré Fringe Method via Scanning Transmission Electron Microscopy

A New Insight into Largely Defocused HAADF-STEM Imaging and Visualization of Strain Field

TEM Nano-Moiré Evaluation for an Invisible Lattice Structure Near the Grain Interface

3D Strain Measurement of Heterostructures Using the Scanning Transmission Electron Microscopy Moiré Depth Sectioning Method

Evaluation of interfacial misfit strain field of heterostructures using STEM nano secondary moire method

Moiré plane wave expansion model for scanning tunneling microscopy simulations of incommensurate two-dimensional materials

STEM Imaging of Lattice Fringes and beyond in a UHR In-Lens Field-Emission SEM

Considerations for extracting moiré-level strain from dark field intensities in transmission electron microscopy

STEM multiplication nano-moiré method with large field of view and high sensitivity

Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy

Atomic-Scale Observation of Moiré potential in Twisted Hexagonal Boron Nitride Layers by Electron Microscopy

Hybrid Moiré Excitons and Trions in Twisted MoTe2–MoSe2 Heterobilayers

Imaging built-in electric fields and light matter by Fourier-precession TEM

Hybrid Moiré Excitons and Trions in Twisted MoTe_2-MoSe_2 Heterobilayers

Geometric aspects of lattice contrast visibility in nanocrystalline materials using HAADF STEM

Exploring TEM Coherence Properties via Speckle Contrast Analysis in Coherent Electron Scattering of Amorphous Material

Imaging, Core-Loss, and Low-Loss Electron-Energy-Loss Spectroscopy Mapping in Aberration-Corrected STEM

Atomic-Scale Observation of Moire potential in Twisted Hexagonal Boron Nitride Layers by Electron Microscopy

Evaluation of interfacial misfit strain field of heterostructures using STEM nano secondary moiré method

Imaging Moiré Excited States with Photocurrent Tunneling Microscopy