An Online Junction Temperature Estimating Method for SiC MOSFETs Based on Steady-State Features and GPR

Qinghao Zhang,Wenrui Li,Pinjia Zhang

DOI: https://doi.org/10.1109/tie.2024.3349585

IF: 7.7

2024-01-01

IEEE Transactions on Industrial Electronics

Abstract:The thermal sensitivity electrical parameter (TSEP) method has gained popularity for online junction temperature (Tj) estimation to enhance the operational reliability of SiC mosfets. However, the performance of existing TSEP methods is affected by varying operating conditions. Achieving a balance between Tj estimation accuracy and cost remains a challenge. To address these issues, this article proposes an online Tj estimation method. First, the on-state voltage and on-state body diode voltage drop are combined as features for Tj estimation. The selection of these two features with different sensitivities under various load current cases improves the accuracy of Tj estimation and enhances the overall sensitivity. Second, Gaussian Process Regression is employed to eliminate the effect of load current from the Tj estimation model, ensuring robustness to operating conditions. Finally, an online Tj estimation strategy based on these innovations is proposed and its effectiveness is validated through multiple experiments in a dc–dc converter under various operating conditions. Compared to conventional methods, the proposed approach demonstrates higher accuracy and stronger robustness against operating conditions.

automation & control systems,engineering, electrical & electronic,instruments & instrumentation