Investigation of structural and reflective characteristics of short‐period Mo/B4C multilayer X‐ray mirrors

Roman Shaposhnikov,Vladimir Polkovnikov,Sergey Garakhin,Yuliy Vainer,Nikolay Chkhalo,Ruslan Smertin,Kirill Durov,Egor Glushkov,Sergey Yakunin,Mikhail Borisov
DOI: https://doi.org/10.1107/s1600577524000419
IF: 2.557
2024-02-11
Journal of Synchrotron Radiation
Abstract:Short‐period Mo/B4C multilayer mirrors are shown to be extremely promising for use in synchrotron applications.The results of a study of the structural and reflective characteristics of short‐period multilayer X‐ray mirrors based on Mo/B4C at wavelengths 1.54 Å, 9.89 Å and 17.59 Å are presented. The period of the samples varied in the range 8–35 Å. The average widths of the interfaces were ∼3.5 and 2.2 Å at one and the other boundaries, with a tendency for weak growth with any decrease in the period. The interlayer roughness was ∼1 Å. The research results indicate promising prospects for the use of multilayer Mo/B4C mirrors for synchrotron applications.
optics,physics, applied,instruments & instrumentation
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