Abstract:A neural network is used for automatic classification of X‐ray diffraction scans and categorizes single‐phase, multi‐phase, and amorphous samples. The network is trained based on simulated patterns that are generated from a cif‐file; no further modifications are necessary to use this system. Hence, this system can be used for rapid screening of vast composition spaces. New materials are frequently synthesized and optimized with the explicit intention to improve their properties to meet the ever‐increasing societal requirements for high‐performance and energy‐efficient electronics, new battery concepts, better recyclability, and low‐energy manufacturing processes. This often involves exploring vast combinations of stoichiometries and compositions, a process made more efficient by high‐throughput robotic platforms. Nonetheless, subsequent analytical methods are essential to screen the numerous samples and identify promising material candidates. X‐ray diffraction is a commonly used analysis method available in most laboratories which gives insight into the crystalline structure and reveals the presence of phases in a powder sample. Herein, a method for automating the analysis of XRD patterns, which uses a neural network model to classify samples into nondiffracting, single‐phase, and multi‐phase structures, is presented. To train neural networks for identifying materials with compositions not matching known crystallographic structures, a synthetic data generation approach is developed. The application of the neural networks on high‐entropy oxides experimental data is demonstrated, where materials frequently deviate from anticipated structures. Our approach, not limited to these materials, seamlessly integrates into high‐throughput data analysis pipelines, either filtering acquired patterns or serving as a standalone method for automated material exploration workflows.

Phase Identification in Synchrotron X-ray Diffraction Patterns of Ti–6Al–4V Using Computer Vision and Deep Learning

Enhancing deep-learning training for phase identification in powder X-ray diffractograms

Integrated analysis of X-ray diffraction patterns and pair distribution functions for machine-learned phase identification

Phase quantification using deep neural network processing of XRD patterns

Neural networks for rapid phase quantification of cultural heritage X‐ray powder diffraction data

A probabilistic deep learning approach to automate the interpretation of multi-phase diffraction spectra

Exploring Supervised Machine Learning for Multi-Phase Identification and Quantification from Powder X-Ray Diffraction Spectra

Deep-learning real-time phase retrieval of imperfect diffraction patterns from X-ray free-electron lasers

Fast and interpretable classification of small X-ray diffraction datasets using data augmentation and deep neural networks

Towards end-to-end structure determination from x-ray diffraction data using deep learning

Adaptively driven X-ray diffraction guided by machine learning for autonomous phase identification

Machine Learning Automated Approach for Enormous Synchrotron X-Ray Diffraction Data Interpretation

Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations

Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis

A deep-learning technique for phase identification in multiphase inorganic compounds using synthetic XRD powder patterns

Three-dimensional coherent X-ray diffraction imaging via deep convolutional neural networks

Real-time 3D Nanoscale Coherent Imaging via Physics-aware Deep Learning

Machine Learning Automated Analysis of Enormous Synchrotron X-ray Diffraction Datasets

Accelerating Materials Discovery: Automated Identification of Prospects from X‐Ray Diffraction Data in Fast Screening Experiments