Fast and interpretable classification of small X-ray diffraction datasets using data augmentation and deep neural networks

Felipe Oviedo,Zekun Ren,Shijing Sun,Charlie Settens,Zhe Liu,Noor Titan Putri Hartono,Ramasamy Savitha,Brian L. DeCost,Siyu I.P. Tian,Giuseppe Romano,Aaron Gilad Kusne,Tonio Buonassisi

2019-04-24

Abstract:X-ray diffraction (XRD) data acquisition and analysis is among the most time-consuming steps in the development cycle of novel thin-film materials. We propose a machine-learning-enabled approach to predict crystallographic dimensionality and space group from a limited number of thin-film XRD patterns. We overcome the scarce-data problem intrinsic to novel materials development by coupling a supervised machine learning approach with a model agnostic, physics-informed data augmentation strategy using simulated data from the Inorganic Crystal Structure Database (ICSD) and experimental data. As a test case, 115 thin-film metal halides spanning 3 dimensionalities and 7 space-groups are synthesized and classified. After testing various algorithms, we develop and implement an all convolutional neural network, with cross validated accuracies for dimensionality and space-group classification of 93% and 89%, respectively. We propose average class activation maps, computed from a global average pooling layer, to allow high model interpretability by human experimentalists, elucidating the root causes of misclassification. Finally, we systematically evaluate the maximum XRD pattern step size (data acquisition rate) before loss of predictive accuracy occurs, and determine it to be 0.16°, which enables an XRD pattern to be obtained and classified in 5.5 minutes or less.

Data Analysis, Statistics and Probability,Materials Science,Machine Learning

What problem does this paper attempt to address?

The paper aims to address the time-consuming issue in the analysis of X-ray diffraction (XRD) data for novel thin film materials, particularly in the application during the development cycle of new thin film materials. Specifically, the authors propose a machine learning method that combines data augmentation techniques to predict the crystal dimensions and space groups of a limited number of thin film XRD patterns. The main contributions of the paper include:

1. **Addressing Data Scarcity**: By combining supervised learning methods and physics-based data augmentation strategies, utilizing simulated data and experimental data from the Inorganic Crystal Structure Database (ICSD), the issue of data scarcity in the development of new materials is overcome.

2. **High-Accuracy Classifier**: An All Convolutional Neural Network was developed for the classification of crystal dimensions and space groups of thin film materials, achieving cross-validation accuracies of 93% and 89%, respectively.

3. **Interpretability Tool**: Average Class Activation Maps were proposed as an interpretability tool for the convolutional neural network trained on spectral data, to enhance the model's interpretability for experimentalists.

By preprocessing, labeling, and augmenting the XRD data of thin film materials, this method significantly improves classification performance and demonstrates good generalization ability on experimental datasets. Additionally, the study explores the impact of data augmentation scale on classification accuracy and finds that when the augmented dataset size reaches approximately 700 spectra, the model performance approaches saturation. This research outcome is expected to be applicable to other types of thin film materials and their crystal parameter predictions.