Deep learning for visualization and novelty detection in large X-ray diffraction datasets

Lars Banko,Phillip M. Maffettone,Dennis Naujoks,Daniel Olds,Alfred Ludwig
DOI: https://doi.org/10.1038/s41524-021-00575-9
IF: 12.256
2021-07-09
npj Computational Materials
Abstract:Abstract We apply variational autoencoders (VAE) to X-ray diffraction (XRD) data analysis on both simulated and experimental thin-film data. We show that crystal structure representations learned by a VAE reveal latent information, such as the structural similarity of textured diffraction patterns. While other artificial intelligence (AI) agents are effective at classifying XRD data into known phases, a similarly conditioned VAE is uniquely effective at knowing what it doesn’t know: it can rapidly identify data outside the distribution it was trained on, such as novel phases and mixtures. These capabilities demonstrate that a VAE is a valuable AI agent for aiding materials discovery and understanding XRD measurements both ‘on-the-fly’ and during post hoc analysis.
materials science, multidisciplinary,chemistry, physical
What problem does this paper attempt to address?