A robust low data solution: Dimension prediction of semiconductor nanorods

Xiaoli Liu,Yang Xu,Jiali Li,Xuanwei Ong,Salwa Ali Ibrahim,Tonio Buonassisi,Xiaonan Wang
DOI: https://doi.org/10.1016/j.compchemeng.2021.107315
2021-07-01
Abstract:<p>Precise control over dimension of nanocrystals is critical to tune the properties for various applications. However, the traditional control through experimental optimization is slow, tedious and time consuming. Herein a robust deep neural network-based regression algorithm has been developed for precise prediction of length, width, and aspect ratios of semiconductor nanorods (NRs). Given there is limited experimental data available (28 samples), a Synthetic Minority Oversampling Technique for regression (SMOTE-REG) is employed first for data generation. Deep neural network is further applied to develop regression model which demonstrated the well performed prediction on both the original and generated data with a similar distribution. The prediction model is further validated with additional experimental data, showing accurate prediction results. Additionally, Local Interpretable Model-Agnostic Explanations (LIME) is used to interpret the weight for each sample, corresponding to its importance towards the target dimension, which is well validated by experimental observations.</p>
engineering, chemical,computer science, interdisciplinary applications
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