Abstract:Accelerated life tests (ALTs) play a crucial role in reliability analyses, providing lifetime estimates of highly reliable products. Among ALTs, step-stress design increases the stress level at predefined times, while maintaining a constant stress level between successive changes. This approach accelerates the occurrence of failures, reducing experimental duration and cost. While many studies assume a specific form for the lifetime distribution, in certain applications instead a general form satisfying certain properties should be preferred. Proportional hazard model assumes that applied stresses act multiplicatively on the hazard rate, so the hazards function may be divided into two factors, with one representing the effect of the stress, and the other representing the baseline hazard. In this work we examine two particular forms of baseline hazards, namely, linear and quadratic. Moreover, certain experiments may face practical constraints making continuous monitoring of devices infeasible. Instead, devices under test are inspected at predetermined intervals, leading to interval-censoring data. On the other hand, recent works have shown an appealing trade-off between the efficiency and robustness of divergence-based estimators. This paper introduces the step-stress ALT model under proportional hazards and presents a robust family of minimum density power divergence estimators (MDPDEs) for estimating device reliability and related lifetime characteristics such as mean lifetime and distributional quantiles. The asymptotic distributions of these estimates are derived, providing approximate confidence intervals. Empirical evaluations through Monte Carlo simulations demonstrate their performance in terms of robustness and efficiency. Finally, an illustrative example is provided to demonstrate the usefulness of the model and associated methods developed.

A new estimation approach based on phi‐divergence measures for one‐shot device accelerated life testing

One-shot device testing data analysis under logistic-exponential lifetimes with an application to SEER Gallbladder cancer data

Robust inference for an interval-monitored step-stress experiment with competing risks for failure

Reliability estimation for one-shot devices under cyclic accelerated life-testing

Robust inference for intermittently-monitored step-stress tests under Weibull lifetime distributions

Robust inference for an interval-monitored step-stress experiment under proportional hazards

Reliability estimation from two types of accelerated testing considering individual difference and measurement error

Robust estimation based on one-shot device test data under log-normal lifetimes

Optimal Constant-Stress Accelerated Life Test Plans for One-Shot Devices with Components Having Exponential Lifetimes under Gamma Frailty Models

Robust Rao-type tests for step-stress accelerated life-tests under interval-monitoring and Weibull lifetime distributions

Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring

Statistical Analysis of Inverse Weibull Constant-Stress Partially Accelerated Life Tests with Adaptive Progressively Type I Censored Data

Semiparametric evaluation of first‐passage distribution for step‐stress accelerated degradation tests

Data‐driven estimation for multithreshold accelerated failure time model

A NEW PERSPECTIVE ON ROBUST M-ESTIMATION: FINITE SAMPLE THEORY AND APPLICATIONS TO DEPENDENCE-ADJUSTED MULTIPLE TESTING

Inference on exponentiated Rayleigh distribution with constant stress partially accelerated life tests under progressive type-II censoring

A General Degradation Process of Useful Life Analysis Under Unreliable Signals for Accelerated Degradation Testing

Maximal entropy prior for the simple step‐stress accelerated test

Reliability estimation for bathtub-shaped distribution under block progressive censoring

Inference on Weibull inverted exponential distribution under progressive first-failure censoring with constant-stress partially accelerated life test

Sequential Selection for Accelerated Life Testing via Approximate Bayesian Inference