Polarimetric modeling and measurement approach for refractory material in the mid-wave infrared

Mingqi Pang,Zelin Shi,Haizheng Liu,Daijun Zhang,Lei Fang,Kunna Yan
DOI: https://doi.org/10.1364/oe.516643
IF: 3.8
2024-05-02
Optics Express
Abstract:Mingqi Pang, Zelin Shi, Haizheng Liu, Daijun Zhang, Lei Fang, Kunna Yan Passive polarimetric imaging has gained substantial attention over the past three decades in various applications in defense. The ... [Opt. Express 32, 17719-17737 (2024)]
optics
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