Abstract:Defect localization aims to locate buggy program elements (e.g., buggy files, methods or lines of code) based on defect symptoms, e.g., bug reports or program spectrum. However, when we receive the defect symptoms, the defect has been exposed and negative impacts have been introduced. Thus, one challenging task is: whether we can locate buggy program prior to the appearance of the defect symptom (e.g., when buggy program elements are being committed to a version control system). We refer to this type of defect localization as “Just-In-Time (JIT) Defect localization”. Although many prior studies have proposed various JIT defect identification methods to identify whether a new change is buggy, these prior methods do not locate the suspicious positions. Thus, JIT defect localization is the next step of JIT defect identification (i.e., after a buggy change is identified, suspicious source code lines are located). To address this problem, we propose a two-phase framework, i.e., JIT defect identification and JIT defect localization. Given a new change, JIT defect identification will identify it as buggy change or clean change first. If a new change is identified as buggy, JIT defect localization will rank the source code lines introduced by the new change according to their suspiciousness scores. The source code lines ranked at the top of the list are estimated as the defect location. For JIT defect identification phase, we use 14 change-level features to build a classifier by following existing approach. For JIT defect localization phase, we propose a JIT defect localization approach that leverages software naturalness with the N-gram model. To evaluate the proposed framework, we conduct an empirical study on 14 open source projects with a total of 177,250 changes. The results show that software naturalness is effective for our JIT defect localization. Our model achieves a reasonable performance, and outperforms the two baselines (i.e., random guess and a static bug finder (i.e., PMD)) by a substantial margin in terms of four ranking measures.

Identification of Failure Regions for Programs With Numeric Inputs

Just-In-Time Defect Identification and Localization: A Two-Phase Framework.

A Dynamic Fault Localization Technique with Noise Reduction for Java Programs

SURE: A Visualized Failure Indexing Approach using Program Memory Spectrum

A General Noise-Reduction Framework for Fault Localization of Java Programs.

A Systematic Study of Failure Proximity

Improving Failure Detection by Automatically Generating Test Cases Near the Boundaries.

New Random Testing-based Fault Localization Approach

Effective Software Fault Localization Using Predicted Execution Results.

A novel failure indexing approach with run-time values of program variables

High-Dimensional and Multiple-Failure-Region Importance Sampling for Sram Yield Analysis

Indexing Noncrashing Failures: A Dynamic Program Slicing-Based Approach

Can Search-Based Testing with Pareto Optimization Effectively Cover Failure-Revealing Test Inputs?

Test Input Reduction for Result Inspection to Facilitate Fault Localization

An In-Depth Study of the Efficiency of Risk Evaluation Formulas for Multi-Fault Localization

A Combinatorial Testing-Based Approach to Fault Localization

A Study of Modified Testing-Based Fault Localization Method

VSBFL: Variable Value Sequence Based Fault Localization for Novice Programs

Spectrum-Based Fault Localization: Testing Oracles Are No Longer Mandatory

An Interleaving Approach to Combinatorial Testing and Failure-Inducing Interaction Identification