Concentration dependence of the fluorescence decay profile in transition metal doped chalcogenide glass

M. Hughes,D. W. Hewak,R. J. Curry,D.W. Hewak,R.J. Curry

DOI: https://doi.org/10.48550/arXiv.1411.7045

2014-11-20

Materials Science

Abstract:In this paper we present the fluorescence decay profiles of vanadium and titanium doped gallium lanthanum sulphide (GLS) glass at various doping concentrations between 0.01 and 1% (molar). We demonstrate that below a critical doping concentration the fluorescence decay profile can be fitted with the stretched exponential function: exp[-(t/{\tau})\b{eta}], where {\tau} is the fluorescence lifetime and \b{eta} is the stretch factor. At low concentrations the lifetime for vanadium and titanium doped GLS was 30 {\mu}s and 67 {\mu}s respectively. We validate the use of the stretched exponential model and discuss the possible microscopic phenomenon it arises from. We also demonstrate that above a critical doping concentration of around 0.1% (molar) the fluorescence decay profile can be fitted with the double exponential function: a*exp-(t/{\tau}1)+ b*exp-(t/{\tau}2), where {\tau}1and {\tau}2 are characteristic fast and slow components of the fluorescence decay profile, for vanadium the fast and slow components are 5 {\mu}s and 30 {\mu}s respectively and for titanium they are 15 {\mu}s and 67 {\mu}s respectively. We also show that the fluorescence lifetime of vanadium and titanium at low concentrations in the oxide rich host gallium lanthanum oxy-sulphide (GLSO) is 43 {\mu}s and 97 {\mu}s respectively, which is longer than that in GLS. From this we deduce that vanadium and titanium fluorescing ions preferentially substitute into high efficiency oxide sites until at a critical concentration they become saturated and low efficiency sulphide sites start to be filled.