Imaging electromagnetic boundary of microdevice using a wide field quantum microscope

Huanfei Wen,Yanjie Liu,Wenyuan Hao,Zijin Fu,Ziheng Gao,Ding Wang,Li Xin,ZHONGHAO Li,Hao Guo,Zongmin Ma,Yanjun Li,Jun Tang,Jun Liu
DOI: https://doi.org/10.1364/oe.514770
IF: 3.8
2024-03-13
Optics Express
Abstract:Huan Fei Wen, Yanjie Liu, Wenyuan Hao, Zijin Fu, Ziheng Gao, Ding Wang, Xin Li, Zhonghao Li, Hao Guo, Zongmin Ma, Yan Jun Li, Jun Tang, Jun Liu Imaging of electronic device surface or sub-surface electromagnetic fields under operating conditions is important for device design and ... [Opt. Express 32, 10829-10840 (2024)]
optics
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