Influence of gate work function variations on characteristics of fin-shaped silicon quantum dot device with multi-gate under existence of gate electrostatic coupling

Kimihiko Kato,Hidehiro Asai,Hiroshi Oka,Shota Iizuka,Hiroshi Fuketa,Takumi Inaba,Takahiro Mori
DOI: https://doi.org/10.1016/j.sse.2024.109013
IF: 1.916
2024-10-25
Solid-State Electronics
Abstract:We explored the effects of gate work function variation (WFV) through device simulation on a fin-shaped silicon quantum dot device with a multi-gate configuration for a large-scale integrated array. The threshold voltage ( V th ) of current–voltage characteristics is affected by WFV in both main and surrounding gates, indicating the existence of electrostatic coupling among these gates. The electrostatic coupling can be reduced by biasing on the surrounding gates. Furthermore, the concept of V th , following conventional transistors, works as a reference of voltage and potential in the present multi-gate device. This knowledge contributes to establishing a practical method for the statistical analysis of qubit variability.
physics, condensed matter, applied,engineering, electrical & electronic
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