Nitrogen Complex-Driven Vacancy Cluster in Group-III Nitrides

Eui-Cheol Shin,Youngho Kang,Sang Ho Jeon
DOI: https://doi.org/10.1021/acsami.4c13648
IF: 9.5
2024-11-06
ACS Applied Materials & Interfaces
Abstract:A series of experiments have elucidated the primary defects in group-III nitride epilayers, identifying vacancy clusters due to cation migration at interfaces to mitigate strained lattice. While the occurrence of these defects is well-documented, the underlying electronic mechanisms driving vacancy agglomeration in nitrides and their alloys remain poorly understood. In this study, we uncovered a previously unreported ground state of two metal vacancies driven by the migration of kinetically...
materials science, multidisciplinary,nanoscience & nanotechnology
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