Characterisation of barium hexaferrite thin films in microwave frequency band

Didier Vincent
DOI: https://doi.org/10.1051/epjap/2024240087
2024-07-25
The European Physical Journal Applied Physics
Abstract:The characterization of barium hexaferrite thin-films at microwave frequencies is important for determining their electromagnetic properties by measuring the elements of the permeability tensor. Layers of 15 μm were deposited by RF sputtering on a coplanar line. By measuring the S parameters under magnetic field conditions, the μ and κ elements of the permeability tensor were extracted and their variations as a function of the applied field were highlighted. Possible applications to absorbent layers are being considered
physics, applied
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