Abstract:Unveiling atomic structures is significant for the relationship construction between microscopic configurations and macroscopic properties of materials. However, we still lack a rapid, accurate, and robust approach to automatically resolve complex patterns in atomic-resolution microscopy. Here, we present a Trident strategy-enhanced disentangled representation learning method (a generative model), which utilizes a few unlabeled experimental images with abundant low-cost simulated images to generate a large corpus of annotated simulation data that closely resembles experimental conditions, realizing simultaneous achievement of high quality and large volumes of the training dataset. A structural inference model is then trained via a residual neural network which can directly deduce the interlayer slip and rotation of diversified and complicated stacking patterns at van der Waals (vdWs) interfaces with picometer-scale accuracy across various materials (ReS2, ReSe2, and MoS2) with different layer numbers (bilayer and trilayers) and demonstrates robustness to defects, imaging quality, and surface contaminations. The framework can also identify pattern transition interfaces, quantify subtle motif variations, and discriminate moiré patterns that are undistinguishable in frequency domains. The high-throughput processing ability of our method helps discover a novel vdW epitaxy where various thermodynamically favorable slip stackings can coexist, demonstrating the machine learning contribution to the new knowledge emergence.

Combining Machine Learning Algorithms with Traditional Methods for Resolving the Atomic-Scale Dynamic Structure Reconstruction of Monolayer MoS2 in High-Resolution Transmission Electron Microscopy

Effects of Non-Rotationally Symmetric Aberrations on the Quantitative Measurement of Lattice Positions in a Graphene Monolayer Using High-Resolution Transmission Electron Microscopy

Exit-wave Phase Retrieval from a Single High-Resolution Transmission Electron Microscopy Image of a Weak-Phase Object

Resolving the Individual Carbon Atoms of Graphene Monolayer by REW Software

Electron ptychography of 2D materials to deep sub-ångström resolution

Exploring electron-beam induced modifications of materials with machine-learning assisted high temporal resolution electron microscopy

Improving the Atomic-Resolution AFM Imaging of Monolayer MoS2for Worn Tips: a Molecular Dynamics Study

Growth Anisotropy and Morphology Evolution of Line Defects in Monolayer MoS2 : Atomic-Level Observation, Large-Scale Statistics, and Mechanism Understanding

Electron Crystallographic Investigation of Crystals on the Mesostructural Scale

Auto-resolving atomic structure at van der Waal interfaces using a generative model

A hierarchical active-learning framework for classifying structural motifs in atomic resolution microscopy

Sub-nanometer depth resolution and single dopant visualization achieved by tilt-coupled multislice electron ptychography

When the atoms dance: exploring mechanisms of electron-beam induced modifications of materials with machine-learning assisted high temporal resolution electron microscopy

Detailed Atomic Reconstruction of Extended Line Defects in Monolayer MoS2.

Exit wave reconstruction of a focal series of images with structural changes in high‐resolution transmission electron microscopy

Combining Structure Modeling and Electron Microscopy to Determine Complex Zeolite Framework Structures

Bulk and Local Structures of Metal–organic Frameworks Unravelled by High-Resolution Electron Microscopy

Dynamic Structural Response and Deformations of Monolayer $MoS_{2}$ Visualized by Femtosecond Electron Diffraction

Uncovering Material Deformations via Machine Learning Combined with Four-Dimensional Scanning Transmission Electron Microscopy

Local Crystallography Analysis for Atomically Resolved Scanning Tunneling Microscopy Images

Atomic-level imaging of beam-sensitive COFs and MOFs by low-dose electron microscopy