Abstract:Optical frequency domain reflectometry (OFDR) has high spatial resolution and measurement accuracy, driving its popularity in various fields. Integration of OFDR technology has made it accessible, cost-effective and deployable in many applications, including battery management and photonic integrated circuits. An integrated OFDR system based on Rayleigh backscattering and silicon photonics technology on an SOI platform has been developed for the first time. The system's simplified configuration was simulated, fabricated and characterized in detail, achieving an experimental spatial resolution of 8.28 μm, matching the theoretical level. This system shows high potential for sensing, monitoring and detection where precise spatial information is crucial. OFDR's accessibility and high performance in distributed measurements make it a promising technology for future advancements.

What problem does this paper attempt to address?

The main problem that this paper attempts to solve is to develop an integrated optical frequency - domain reflectometer (OFDR) system based on Rayleigh backscattering and silicon photonics technology to achieve high - resolution distributed measurement. Specifically, the paper aims to overcome the limitations of existing fiber - optic OFDR systems in terms of size, weight, and integration, so that it can be better applied to battery management systems (BMS) and other sensing and monitoring fields with extremely high requirements for spatial resolution. ### Key Problems and Solutions in the Paper 1. **Limitations of Existing Systems**: - Existing fiber - optic OFDR systems are difficult to integrate with applications such as battery management systems (BMS) due to their large size and weight. - These limitations have hindered the further development of OFDR technology in frontier fields. 2. **Proposed New Schemes**: - **Integrated OFDR System**: For the first time, the paper presents an integrated OFDR system based on Rayleigh backscattering and silicon photonics technology. This system uses a silicon - on - insulator (SOI) platform, which has the advantages of high integration density, low power consumption, and compatibility with standard complementary metal - oxide - semiconductor (CMOS) technology. - **Simplified Configuration**: By using a multimode interference (MMI) coupler instead of traditional fiber couplers and optical circulators, the system design is simplified and the manufacturability and ease of operation are improved. - **High Resolution**: The integrated OFDR system has achieved an experimental spatial resolution of 8.28 μm, reaching the theoretical level, showing its potential in high - precision sensing and monitoring. ### Main Contributions - **Technological Breakthrough**: For the first time, an integrated OFDR system based on Rayleigh backscattering has been successfully implemented on the SOI platform. - **Performance Improvement**: Compared with the existing silicon nitride (Si₃N₄) platform, this system has significant improvements in both spatial resolution and chip size. - **Application Prospects**: This system provides a new solution for high - precision distributed measurement, and has broad application prospects especially in fields such as battery management and photonic integrated circuits. ### Summary By developing a new type of integrated OFDR system, the paper has solved the limitations of existing fiber - optic OFDR systems in terms of size, weight, and integration, and has achieved higher spatial resolution and better integration performance. This provides important technical support and development directions for future high - precision sensing and monitoring technologies.

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