Crystal structure, far-infrared spectroscopy, and microwave dielectric properties of two novel vanadates CaRECeV3O12 (RE = Nd, Sm)

Zhiyuan Zhang,Jinwu Chen,Ying Tang,Huaicheng Xiang,Jie Li,Liang Fang,Junqi Chen

DOI: https://doi.org/10.1016/j.ceramint.2023.04.146

IF: 5.532

2023-04-01

Ceramics International

Abstract:Two novel low-ε r CaRECeV3O12 (RE = Nd, Sm) microwave dielectric ceramics were prepared to utilize the solid-state method. According to XRD and Raman spectroscopy data, the CaRECeV3O12 (RE = Nd, Sm) ceramics had a tetragonal zircon-type with an I41/amd space group. Dense CaNdCeV3O12 and CaSmCeV3O12 ceramics sintered at 1225 °C and 1200 °C showed ε r ∼11.85 ± 0.1 and 11.33 ± 0.1, Q × f ∼40,100 ± 500 GHz and 43,290 ± 500 GHz, τ f  ∼ −27.2 ± 0.5 ppm/°C and −22.4 ± 0.5 ppm/°C, along with α L of 9.4 ppm/°C and 8.5 ppm/°C, respectively. The measured ε r and corrected ε r(corr) values were larger than ε r(C-M) (9.41 and 9.47) in CaNdCeV3O12 and CaSmCeV3O12 due to the cations being, on average, under-bonded and the overall structures being in a slightly expanded state. The slightly higher | < d > | value of CaNdCeV3O12 led to its higher ε r(corr) value, even though it had a lower α D /V m value. The sign and magnitude of τ f values for CaNdCeV3O12 and CaSmCeV3O12 were mainly determined by their positive temperature coefficients of dielectric polarizability τ αm of +36.2 ppm/°C and +32.1 ppm/°C, respectively. The inherent dielectric constant and dielectric loss were examined using far-infrared reflectivity spectra, Raman spectra, and the packing fraction.

materials science, ceramics