Identifying exploitable memory objects for out‐of‐bound write vulnerabilities

Runhao Li,Bin Zhang,Chaojing Tang
DOI: https://doi.org/10.1049/ell2.13136
2024-02-27
Electronics Letters
Abstract:The study proposes a novel method for identifying potential exploitable memory objects. It focuses on corrupted data propagation processes and designs a corrupted data‐oriented fuzzing method. Exploiting an out‐of‐bounds write vulnerability in general‐purpose applications has become a current research focus. Given the large scale of code in programs, selecting appropriate memory objects for exploitation is challenging. This letter proposes a corrupted data propagation‐guided fuzzing method. By tracking the propagation process of corrupted data among memory objects, a multi‐level fuzzing schedule is proposed to search the execution paths. Experimental results show that this proposed method, EMOFuzz, can effectively identify exploitable objects under various overflow lengths, significantly enhancing the efficiency of exploitability analysis.
engineering, electrical & electronic
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