Simulation of reciprocal space mapping using a new analytical solution of kinematical X-ray diffraction in a crystal

Vasily Punegov
DOI: https://doi.org/10.1107/s2053273324011422
2024-11-30
Acta Crystallographica Section A Foundations and Advances
Abstract:New analytical solutions describing the diffraction of a restricted X-ray beam from a thin crystal are obtained in the kinematical approximation. X-ray reciprocal space mapping for a silicon crystal was simulated using analytical solutions, as well as numerical methods based on two-dimensional recurrence relations and Takagi–Taupin equations.
chemistry, multidisciplinary,crystallography
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