Abstract:We present a new approach for simulating x-ray nanobeam Bragg coherent diffraction patterns based on the Takagi-Taupin equations. Compared to conventional methods, the current approach can be universally applied to any weakly strained system including semi-infinite crystals that diffract dynamically. It addresses issues such as the curved wavefront and re-divergence of the focused incident beam. We show excellent agreement against experimental data on a strained La0.7Sr0.3MnO3 thin film on SrTiO3 substrate, and a path to extracting physical information using automatic differentiation.

What problem does this paper attempt to address?

This paper mainly addresses the key issues in the simulation of X-ray nano-beam Bragg coherent diffraction, especially when using focused beams and dealing with complex material systems involving dynamic diffraction such as semi-infinite crystals. The traditional iterative phase retrieval methods based on Fourier transform cannot handle the diffraction intensity of thin films influenced by strong substrate Bragg peaks. The paper proposes a new method based on the Takagi-Taupin equation, which can be universally applied to weakly strained systems, including semi-infinite crystals with dynamic diffraction. The new method solves the problems of wavefront curvature and divergence of focused incident beams and is compatible with phase retrieval methods. The effectiveness of this method is validated by quantitative comparison with experimental data, especially in the treatment of the diffraction pattern of strained La0.7Sr0.3MnO3 films on SrTiO3 substrates. In addition, the paper demonstrates how to use automatic differentiation to retrieve lattice strain and film thickness simultaneously from diffraction patterns. The paper also discusses how to extend the Takagi-Taupin equation to simulate X-ray nano-beam Bragg coherent diffraction, including the propagation of focused beams, curved wavefronts, and divergence. With the establishment of a numerical framework, this method can simulate data from different samples and detector angles, and its similarity to neural networks allows for the application of optimizers in the inverse process, such as gradient descent optimization. In conclusion, the paper provides a new simulation technique for X-ray nano-beam diffraction, which can more accurately simulate the diffraction patterns of complex material systems and provide a foundation for phase retrieval and 3D crystal strain mapping.

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