Abstract:Nanoscale heterogeneity (including size, shape, strain, and defects) significantly impacts material properties and how they function. Bragg coherent x-ray imaging methods have emerged as a powerful tool to investigate, in three-dimensional detail, the local material response to external stimuli in reactive environments, thereby enabling explorations of the structure-defect-function relationship at the nanoscale. Although progress has been made in understanding this relationship, coherent imaging of extended samples is relatively slow (typically requiring many minutes) due to the experimental constraints required to solve the phase problem. Here, we develop Bragg coherent modulation imaging (BCMI), which uses a modulator to solve the phase problem thereby enabling fast, local imaging of an extended sample. Because a known modulator is essential to the technique, we first demonstrate experimentally that an unknown modulator structure can be recovered by using the exit wave diversity that exists in a standard Bragg coherent diffraction imaging (BCDI) experiment. We then show with simulations that a known modulator constraint is sufficient to solve the phase problem and enable a single view of an extended sample that is sensitive to defects and dislocations. Our results pave the way for BCMI investigations of strain and defect dynamics in complex extended crystals with temporal resolution limited by the exposure time of a single diffraction pattern.

What problem does this paper attempt to address?

This paper aims to solve the problem of rapidly and locally imaging strain and defects in extended samples. Specifically, although the traditional Bragg Coherent Diffraction Imaging (BCDI) technique can provide three - dimensional detailed images of material responses, it is slow in imaging extended samples and usually takes several minutes. This is mainly due to the experimental conditions that limit the solution of the phase problem. To solve this problem, the author has developed a new imaging method - Bragg Coherent Modulation Imaging (BCMI). ### Main contributions of the paper: 1. **Introduction of modulator**: By using a modulator to solve the phase problem, rapid and local imaging of extended samples can be achieved. The introduction of the modulator enables the acquisition of sample information in a single diffraction pattern without the need for measurements at multiple overlapping scan positions, which significantly improves the time resolution. 2. **Recovery of modulator structure**: The author first demonstrates experimentally how to recover the structure of an unknown modulator from standard BCDI experimental data. This is achieved by using the diversity of the outgoing waves of a known crystal to constrain the modulator structure. 3. **Simulation verification**: Through simulation experiments, the author proves that the constraints of a known modulator are sufficient to solve the phase problem and can sensitively detect defects and dislocations in extended samples in a single view. 4. **Application prospects**: The BCMI technique provides a new tool for studying the strain and defect dynamics in complex extended crystals, especially in reaction environments, and can image with high time resolution limited by the exposure time of the diffraction pattern. ### Formula analysis: - **Interaction between modulator and outgoing wave**: \[ U(\mathbf{q}_x, \mathbf{q}_y, \delta q_z) = \mathcal{F}_r \left( \int P(x, y, z) \cdot e^{i k \mathbf{q} \cdot \mathbf{r}} \rho(x, y, z) \, dz \right) \] where $\delta q_z$ represents the degree of deviation from the maximum of the Bragg peak, $P$ is the probe, and $\mathcal{F}_r$ is the Fresnel propagation operator. - **Iterative phase recovery algorithm**: \[ M_{i + 1} = M_i + \alpha U_i^* \left( \frac{\psi' - \psi}{|U_i|^2} \right) \] where $M_i$ is the current best modulator estimate, $\alpha$ is the gradient step size, $U_i^*$ is the complex conjugate of $U_i$, $\psi$ is the modulated wave field, and $\psi'$ is the wave field after modulus projection. ### Conclusion: By introducing a modulator, the BCMI technique can rapidly and locally image strain and defects in extended samples in a single diffraction pattern, which provides a powerful tool for studying the nano - scale structure - defect - function relationships in materials.

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