Neural Network-Based and Modeling With High Accuracy and Potential Model Speed

M. Kao,Chenming Hu,Chien-Ting Tung
DOI: https://doi.org/10.1109/TED.2022.3208514
IF: 3.1
2022-11-01
IEEE Transactions on Electron Devices
Abstract:In this brief, we demonstrate a neural network (NN)-based device modeling framework. This NN model is built to model advanced field-effect transistors (FETs). Specific transfer functions and loss functions are chosen to achieve high accuracy and smoothness in the output of this NN model. Both <inline-formula> <tex-math notation="LaTeX">${I}$ </tex-math></inline-formula>–<inline-formula> <tex-math notation="LaTeX">${V}$ </tex-math></inline-formula> (current–voltage) and <inline-formula> <tex-math notation="LaTeX">${C}$ </tex-math></inline-formula>–<inline-formula> <tex-math notation="LaTeX">${V}$ </tex-math></inline-formula> (capacitance–voltage) characteristics are studied in this work. Speed comparison between the NN-based model and Berkeley short-channel IGFET model (BSIM) has been done to show that NN has a great potential to accelerate circuit simulation speed. We also present that this NN modeling framework is not only useful for more Moore technologies [e.g., gate-all-around FET (GAAFET)] but also beyond Moore transistors [e.g., negative capacitance FET (NCFET)].
Computer Science,Engineering,Physics
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